2019
DOI: 10.1007/s11664-019-07513-y
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A Computational Study of a Heterostructure Tunneling Carbon Nanotube Field-Effect Transistor

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Cited by 4 publications
(4 citation statements)
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“…Figure 1a shows the MFM CNT tunneling FET under investigation, which is similar to the conventional CNT tunnel FET with the exception of the gating structure, which is a simple gate metal in the conventional device, 2,15 while it is constituted by a metal-ferroelectric-metal configuration in the proposed CNT-based TFET. [26][27][28] The conventional p-i-n carbon nanotube doping profile 2,19 is shown in Fig. 1b.…”
Section: Device Structurementioning
confidence: 99%
See 1 more Smart Citation
“…Figure 1a shows the MFM CNT tunneling FET under investigation, which is similar to the conventional CNT tunnel FET with the exception of the gating structure, which is a simple gate metal in the conventional device, 2,15 while it is constituted by a metal-ferroelectric-metal configuration in the proposed CNT-based TFET. [26][27][28] The conventional p-i-n carbon nanotube doping profile 2,19 is shown in Fig. 1b.…”
Section: Device Structurementioning
confidence: 99%
“…13,14 For this reason, several improvement techniques have been proposed to mitigate the DSDT issue while boosting the performance of the ultrascaled CNT-TFET. Particularly, we cite some approaches, which have been reported to improve the CNT-TFET at ultrascaled regime, namely, the use of p-n doping profile, 15 dielectric engineering, 16 doping engineering, 17,18 heterostructure engineering, 19 ungated region, 20 dual-material gate design, 21 and strain engineering. 22 Therefore, more approaches and improvements techniques should be proposed to increasingly boost the performance of ultrascaled CNT-based TFETs.…”
mentioning
confidence: 99%
“…Utilizing the band-to-band tunneling property of a transistor, tunneling FETs (TFETs) can be constructed. Tahaei et al proposed a heterojunction T-CNTFET which performs better than typical TFETs [11]. Variation in the doping profile of the CNT channel can be explored to construct a better performing device.…”
Section: Introductionmentioning
confidence: 99%
“…6,7 In order to improve the electrical properties of tunnel transistors, various methods have been used, including electrically doping or charge plasma, lightly doping, Schottky-Ohmic structure, multimaterial gate, and heterogeneous structures. [8][9][10][11][12][13] In most of previous studies, the main objective has been to reduce am-bipolar and leakage current and the ON-current is not significantly changed. The analog parameters of the above structures have also been less investigated.…”
mentioning
confidence: 99%