A high‐voltage scanning transmission electron microscope at Nagoya University

Hibino, Michio; Shimoyama, Hiroshi; Maruse, Susumu

doi:10.1002/jemt.1060120312

Cited by 7 publications

(5 citation statements)

References 2 publications

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“…Therefore, they have to be corrected simultaneously. A number of different concepts-time dependent fields [21][22][23] grid and foils in the electron path [24,25], numerical image reconstruction from a defocus series [26] and electron mirrors [27][28][29]-have been proven theoretically and experimentally capable for this purpose. However, up to now, the aberration correction in a LEEM or PEEM system could not yet successfully improve the lateral resolution.…”

Section: Introductionmentioning

confidence: 99%

Double aberration correction in a low-energy electron microscope

et al. 2010

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Section: Introductionmentioning

confidence: 99%

Double aberration correction in a low-energy electron microscope

et al. 2010

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“…The first is in its high efficiency of defect introduction [4]. For A high voltage electron microscope H-1250ST at Nagoya University has functions of both scanning transmission electron microscopy (STEM) and conventional transmission microscopy (CTEM) [5]. Using this advantageous features, it is possible to perform the observation of structural changes by electron irradiation with its CTEM, and to control electron beam with scanning coil of STEM.…”

mentioning

confidence: 99%

Development and application of intermittent electron irradiation technique with a high voltage electron microscope

Arai

Yokoi

Morita

et al. 1993

Microsc. Microanal. Microstruct.

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Abstract. 2014 For the purpose to observe and analyze the transient phenomena after the start of irradiation and the relaxation phenomena after the cessation of irradiation, techniques for intermittent electron irradiation are developed with a high voltage electron microscope, utilizing the STEM function installed in H-1250ST. One of the two methods developed is to make move the electron beam along a circle passing the area of interest in each cycle, which has an advantageous feature of invariant accumulated irradiation time regardless of the frequency. In another method, the electron beam goes back and forth between two positions, in which there is a free choice of the combination of the on-and off-time of electron beam. Dynamical control of electron beam position is made with two deflection coils placed at a right angle, which are driven by a computer loaded with two-phase-signal oscillator through D/A converter. Examples of applications are quoted on the relaxation effect of accumulated point defects on the nucleation and growth of interstitial clusters introduced in metals by electron irradiation.

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“…3 The preconditions for the validity of Scherzer's theorem are round lenses, real images, static fields, no space charge, and that the potential and its derivative are continuous. 10 None of the proposals in connection with high-frequency lenses or grids or foils could be experimentally realized successfully; for a review, see Ref. Despite numerous attempts based on different methods only the use of multipole correctors in highresolution transmission electron microscopy and also in scanning electron microscopy was successful up to now ͑see, e.g., Ref.…”

Section: Ways To Circumvent Preconditions Of Scherzer's Theoremmentioning

confidence: 99%