Correction of chromatic and spherical aberration in electron microscopy utilizing the time structure of pulsed excitation sources

Schönhense, G.; Spiecker, Heinrich

doi:10.1116/1.1523373

Cited by 50 publications

(24 citation statements)

References 14 publications

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“…It requires new strategies for dealing with the energy-dependence of the spin asymmetry and the chromatic aberration of the electron-optical system. In the future, the usable energy interval could be expanded by dynamic aberration correction as discussed in [125]. The method will prove its advantages in low-intensity experiments (like HAXPES), for reactive or radiationsensitive (organic) samples and in high-resolution applications, where the number of resolved time slices can be very large.…”

Section: Future Of Multichannel Spin Detection: Prospects and Obstaclesmentioning

confidence: 98%

Space-, time- and spin-resolved photoemission

Schoenhense

Medjanik

Elmers

2015

Journal of Electron Spectroscopy and Related Phenomena

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This article reviews photoemission experiments that simultaneously resolve at least two of the following degrees of freedom: space (real and momentum space), time (intrinsic time scale of a fast experiment or time-of-flight) and spin. In the spatiotemporal domain, imaging of fast processes by PEEM gives direct insight into plasmon dynamics or magnetization processes. In the category real space & spin the novel concept of imaging spin filters is discussed. In the time & spin chapter we address time-of-flight spin detectors and ultrafast spin processes that are accessible by pump-and-probe techniques. A main part of the paper is devoted to the resolution of momentum-space & time. This is implemented in form of the time-of-flight momentum microscope, a very recent development of which the first instrument has been in operation since 2014. In an extended outlook chapter, the potential of new developments and of a novel, highly parallelized delay-line type electron detector will be discussed. The combination of all three degrees of freedom k-space, time & spin is emerging through the combination of the ToF momentum microscope with imaging spin filter. Outline

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Section: Future Of Multichannel Spin Detection: Prospects and Obstaclesmentioning

confidence: 98%

Space-, time- and spin-resolved photoemission

Schoenhense

Medjanik

Elmers

2015

Journal of Electron Spectroscopy and Related Phenomena

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“…Therefore, they have to be corrected simultaneously. A number of different concepts-time dependent fields [21][22][23] grid and foils in the electron path [24,25], numerical image reconstruction from a defocus series [26] and electron mirrors [27][28][29]-have been proven theoretically and experimentally capable for this purpose. However, up to now, the aberration correction in a LEEM or PEEM system could not yet successfully improve the lateral resolution.…”

Section: Introductionmentioning

confidence: 99%

Double aberration correction in a low-energy electron microscope

et al. 2010

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“…35) Electrons with different energies (which give rise to chromatic aberrations) have different velocities and pass therefore the corrector at different times. If the corrector is fast enough, it can change the focal properties of the lens so that all energies are focused in the same point.…”

Section: ．Aberration Correctionmentioning

confidence: 99%

Nanoscale Imaging and Spectroscopy with XPEEM

Heun

2005

Journal of The Surface Science Society of Japan

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The continuous miniaturization and increasing complexity of the materials used in modern technology requires to have access to chemical composition, electronic structure, magnetization, and fluctuations in these properties at sub-micron and nanometer scales. X-ray photoemission electron microscopy (XPEEM) can provide this information. The recent years have seen a strong increase in XPEEM activities worldwide. This paper reviews the present situation and future developments of XPEEM in combination with synchrotron radiation. In particular, the role of energy filtering, aberration correction, and temporal resolution is discussed. 1．IntroductionX-ray photoelectron spectroscopy (XPS) and the related technique , X-ray absorption spectroscopy (XAS), are powerful tools for the analysis of surfaces, as widely discussed in this issue. In a traditional experimental setup, the spectroscopic signal is obtained from a spot of some 100 µm to millimeters in diameter, and therefore averages over this area. On the other hand, the progress in modern nanotechnology has fueled an evergrowing demand to perform XPS and XAS from areas as small as the smallest building blocks of those nanostructures . This has triggered the development of special instruments which combine spectroscopy and microscopy and allow to perform XPS and XAS with the highest possible lateral resolution of less than 100 nm. 1)More than 10 years ago, two basic, complemetary design principles have been identified to achieve this goal:2) the scanning and the direct imaging type instruments. In the scanning type instruments the photon beam is demagnified, i.e. the X-rays are focused by an optical system (like a Fresnel zone plate or a Schwarzschild objective) on a small spot on the sample. The photoelectrons excited from this area are then collected by a detector. The lateral resolution of the instrument is given by the size of the illuminated area. A surface map can be obtained by scanning the sample relative to the beam. More details of this kind of instruments can be found in the article of T. Munakata in this issue.

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Correction of chromatic and spherical aberration in electron microscopy utilizing the time structure of pulsed excitation sources

Cited by 50 publications

References 14 publications

Space-, time- and spin-resolved photoemission

Space-, time- and spin-resolved photoemission

Double aberration correction in a low-energy electron microscope

Nanoscale Imaging and Spectroscopy with XPEEM

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