A low-speed BIST framework for high-performance circuit testing

Speek, H.; Kerkhoff, Hans G.; Shashaani, M.; Sachdev, Manoj

doi:10.1109/vtest.2000.843865

Cited by 6 publications

(3 citation statements)

References 19 publications

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“…First the basic principles of a controllable-delay flip-flop will be shown as this type of flip-flop forms the basis of our DfDT structure. The detail description of the behaviour and usage of controllable-delay flip-flops in a system environment can be found in [4,11]. …”

Section: The Detection Of Delay Faultsmentioning

confidence: 99%

“…This architecture and its components have been described in detail and simulated in VHDL at system level and using HSPICE data for different blocks in previous work [3,4]. In this paper, the complete architecture has been simulated at circuit level, making use of HSPICE and using the 0.35 pm TSMC CMOS technology from MOSIS [12].…”

Section: The Dfdt Structure Usedmentioning

confidence: 99%

“…In this paper, the complete architecture has been simulated at circuit level, making use of HSPICE and using the 0.35 pm TSMC CMOS technology from MOSIS [12]. Readers are referred to [3,4,11] for more details on previous results. …”

Section: The Dfdt Structure Usedmentioning

confidence: 99%

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Reducing the susceptibility of design-for-delay-testability structures to process- and application-induced variations

Vermaak

Kerkhoff²

IEEE European Test Workshop, 2001.

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Recently, a new type of Design-for-Delay-Testability structure and associated Built-In Self-Test architecture for detecting delay faults in digital high-performance circuits has been proposed. It circumvents the requirement of an expensive high-speed tester. In this paper, the susceptibility of the proposed structure to process-and application-induced variations has been investigated Due to the critical timing necessary when detecting small delay faults it is crucial to know what to expect +om these variations and subsequently reduce their influence.

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Section: The Detection Of Delay Faultsmentioning

confidence: 99%

Section: The Dfdt Structure Usedmentioning

confidence: 99%