2009
DOI: 10.1143/jjap.48.082301
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A Method of Obtaining Simultaneous Complementary Spectroscopic Information on Self-Assembled Quantum Dots

Abstract: A method is presented for the virtually simultaneous application of the complementary spectroscopic techniques of photoluminescence (PL), photoreflectance (PR), and surface photovoltage spectroscopy (SPS), for the non-destructive optical characterisation of selfassembled quantum dots (QD). As an example, we study InAs/InGaAs/InP QD structures emitting at 2 mm. The procedure ensures that the same sample spot is studied by the three different spectroscopic techniques under almost identical conditions. This is ve… Show more

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Cited by 3 publications
(2 citation statements)
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“…All spectra were measured using the conventional combination of a single-grating monochromator, InGaAs photodiode detector, and lock-in amplifier. 15 …”
Section: à3mentioning
confidence: 99%
“…All spectra were measured using the conventional combination of a single-grating monochromator, InGaAs photodiode detector, and lock-in amplifier. 15 …”
Section: à3mentioning
confidence: 99%
“…22,23) Sharma and coworkers also demonstrated the use of complementary spectroscopic techniques, which showed that PL and SPV spectroscopies are powerful tools for the nondestructive optical characterization of InAs=InGaAs=InP QD structures. 24,25) In this work, we conduct SPV and PL spectroscopic techniques to characterize the optical properties of GaAsSb=GaAs type-II QWs with top InAs QD layer composite structures grown by gas-source molecular beam epitaxy (GSMBE). The optical transitions from QDs, the wetting layer (WL), as well as GaAsSb=GaAs QWs were investigated.…”
Section: Introductionmentioning
confidence: 99%