2019
DOI: 10.1109/tvlsi.2019.2910792
|View full text |Cite
|
Sign up to set email alerts
|

A Near-Threshold Spiking Neural Network Accelerator With a Body-Swapping-Based $In \,\,Situ$ Error Detection and Correction Technique

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
14
0

Year Published

2020
2020
2025
2025

Publication Types

Select...
4
2

Relationship

0
6

Authors

Journals

citations
Cited by 15 publications
(14 citation statements)
references
References 31 publications
0
14
0
Order By: Relevance
“…To avoid this hassle, many near-threshold EDaC designs opt for a latch based pipeline [10], [12], [15]. This circumvents the need for hold-constraints that match the DW and allows to use halve the clock period as a DW.…”
Section: B Detection Windowmentioning
confidence: 99%
See 3 more Smart Citations
“…To avoid this hassle, many near-threshold EDaC designs opt for a latch based pipeline [10], [12], [15]. This circumvents the need for hold-constraints that match the DW and allows to use halve the clock period as a DW.…”
Section: B Detection Windowmentioning
confidence: 99%
“…However, a latch based pipeline exhibits a significant area and energy overhead compared to a FF pipeline [10], [12], [14]. Furthermore, the works in [12] & [15] combine this with a sparse insertion-rate where the DW is shared over multiple pipeline stages through time-borrowing. Despite the fact that a complex static-timing analysis is done to guarantee that the total borrowing never exceeds the DW, this makes it easier for critical signals to be masked from the detectors by the processor's activity pattern.…”
Section: B Detection Windowmentioning
confidence: 99%
See 2 more Smart Citations
“…Lowering supply voltages to the near-threshold voltage (NTV) region is one of the effective techniques for achieving higher energy efficiency in energy-constrained circuits [1][2][3]. However, NTV operations also cause new challenges due to the increasing delay caused by process, voltage and temperature (PVT) variations under the scaling voltages [2].…”
Section: Introductionmentioning
confidence: 99%