“…In the past, a large body of prior work examined the failure characteristics of flash cells in controlled environments using small numbers e.g., tens) of raw flash chips (e.g., [36,23,21,27,22,25,16,33,14,5,18,4,24,40,41,26,31,30,37,6,11,10,7,13,9,8,12,20]). This work quantified a variety of flash cell failure modes and formed the basis of the community's understanding of flash cell reliability.…”