14th Asian Test Symposium (ATS'05) 2005
DOI: 10.1109/ats.2005.13
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A New, Flexible and Very Accurate Crosstalk Fault Model to Analyze the Effects of Coupling Noise between the Interconnects on Signal Integrity Losses in Deep Submicron Chips

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Cited by 4 publications
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“…The terms V ip (s) and V op (s) in (1), and the terms V ia (s) and V oa (s) in (2) represent the input and output signals of the victim and aggressor, respectively, in s (Laplace) domain. Note that the crosstalk model developed in [6] also used similar results; however, the same model was applied strictly for a defect-free parallel aggressorvictim model. The previous model has been extended and utilized here for crosstalk fault simulation of defective parallel aggressor-victim interconnects.…”
Section: Crosstalk Fault Model Of Defective Pair Of Interconnectsmentioning
confidence: 95%
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“…The terms V ip (s) and V op (s) in (1), and the terms V ia (s) and V oa (s) in (2) represent the input and output signals of the victim and aggressor, respectively, in s (Laplace) domain. Note that the crosstalk model developed in [6] also used similar results; however, the same model was applied strictly for a defect-free parallel aggressorvictim model. The previous model has been extended and utilized here for crosstalk fault simulation of defective parallel aggressor-victim interconnects.…”
Section: Crosstalk Fault Model Of Defective Pair Of Interconnectsmentioning
confidence: 95%
“…Similarly, the other signal combinations including the skewed input signal can be applied as the input to the aggressor and the victim, following the procedure as described in our previous paper [6].…”
Section: Transient Response and Loss Estimationmentioning
confidence: 99%
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