A New Versatile Electron-Beam Ion Trap

Currell, Frederick; Asada, Junji; Ishii, Koichi; Minoh, Arimichi; Motohashi, Kenji; Nakamura, Nobuyuki; Nishizawa, K.; Ohtani, S.; Okazaki, Kiyohiko; Sakurai, Minoru; Shiraishi, Hiroshi; Tsurubuchi, Seiji; Watanabe, Hirofumi

doi:10.1143/jpsj.65.3186

Cited by 108 publications

(40 citation statements)

References 26 publications

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“…Highly charged ions of iodine were generated in an electron beam ion trap called the Tokyo EBIT [16,17] and transported to the observation chamber via the beam line [18]. The source material was methyl iodide ðCH 3 IÞ, and the resultant ions were I qþ with q = 10-50, mixed with the carbon ions, and residual nitrogen and oxygen.…”

Section: Methodsmentioning

confidence: 99%

Guiding and blocking of highly charged ions through a single glass capillary

Nakayama

Tona

Nakamura

et al. 2009

Nuclear Instruments and Methods in Physics Research Section B:

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Section: Methodsmentioning

confidence: 99%

Guiding and blocking of highly charged ions through a single glass capillary

Nakayama

Tona

Nakamura

et al. 2009

Nuclear Instruments and Methods in Physics Research Section B:

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“…In the present study, an EBIT in Tokyo [22] was used. In order to investigate the Z dependence of the GBI effect, iodine (Z 53), holmium (Z 67), and bismuth (Z 83) were studied.…”

mentioning

confidence: 99%

Evidence for Strong Breit Interaction in Dielectronic Recombination of Highly Charged Heavy Ions

et al. 2008

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“…Highly charged ions were produced by an electron beam ion trap at the University of Electrocommunications, Tokyo-EBIT [8]. An electron beam ion trap (EBIT) or an electron beam ion source (EBIS) is a typical ion source for producing HCIs in very high charge states.…”

Section: Methodsmentioning

confidence: 99%