A Novel Power Injection Model of IPFC for Power Flow Analysis Inclusive of Practical Constraints

Abstract

Electromigration issue caught our attention during a recent effort to design and develop a high current and high current density pulsed power system. At very high current density, a few kA/mm2, the electromigration phenomena will occur. Momentum transfer between electrons and metal atoms at high current density causes electromigration. The reliability and lifetime of pulsed power device can be severely reduced by electromigration. In this paper, we discuss issues such as device reliability model, incubation time of electromigration, lifetime of device, and design tradeoffs.

Optimal Location of IPFC for Improving Power System Performance Using Cuckoo Search Algorithm

“…The voltage deviation at each bus should be as small as possible and the LVD for each bus can be expressed as [17]:…”

“…Equation (17) shows that the stochastic equation for random walk. Random walk is based on Markov chain whose next status depends on the current location and the transition probability.…”

“…Distributed network reconfiguration for power loss minimization, load frequency control, voltage profile improvement for nonlinear interconnected power system using CS algorithm has been studied [14], [15]. Multi-objective short-term scheduling and non-convex economic dispatch considering system characteristics including valve-point effects, multiple fuels, prohibited zones and power loss using CS method has been studied [16], [17]. Line utilization factor (LUF) is used to determine the percentage of loading by DOI: 10.9790/1676-1104013343 www.iosrjournals.org 34 | Page considering real and reactive power flowing in the line [18].…”

A current-based model of an IPFC for Newton–Raphson power flow

“…The first of them is the voltage source model (VSM) [1] and the second one is the power injection model (PIM) [17].…”

“…A comparison of the current-based model and the PIM could be performed on the basis of the data presented in [17] (Table 4). For the IEEE 300 bus system the calculations were carried out with the proposed model for the same reference values as was done in [17], i.e., REF 1 being the active power P RT1 of branch 1, REF 2 being the reactive power Q RT1 of branch 1 and REF 3 being the active power P RT2 of branch 2.…”