1982
DOI: 10.1116/1.571621
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A positive test of the LCAO theory of heterojunctions: Microscopic measurements of band discontinuities at CdS–Ge and InP–Ge interfaces

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Cited by 9 publications
(3 citation statements)
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“…Unfortunately, one cannot easily follow the band-bending changes by monitoring the Figure 14.7 A practical case of band-bending effects during the formation of a heterojunction interface. [11]. This reflects the band-bending evolution on the CdS side.…”
Section: An Alternate General Methods To Measure Band Discontinuitiesmentioning
confidence: 78%
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“…Unfortunately, one cannot easily follow the band-bending changes by monitoring the Figure 14.7 A practical case of band-bending effects during the formation of a heterojunction interface. [11]. This reflects the band-bending evolution on the CdS side.…”
Section: An Alternate General Methods To Measure Band Discontinuitiesmentioning
confidence: 78%
“…Second, the devices to focus X-rays Figure 14.13 During the InPeGe interface formation process, the In4d photoemission peak is both shifted in energy and deformed. [11]. (Data derived from Ref.…”
Section: Photoemission Spectromicroscopymentioning
confidence: 99%
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