Proceedings of 2016 International Conference on Modeling, Simulation and Optimization Technologies and Applications (MSOTA2016) 2016
DOI: 10.2991/msota-16.2016.39
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A Restrain Method of Polarization Effect in GaN/AlGaN RTD

Abstract: Abstract-Polarization effects and polarization charges on the interfaces between GaN and AlGaN in GaN/AlGaN RTD on cplane GaN substrate destroy its RT conditions. To pave the way for electron transportation through GaN/AlGaN RTD in the mode of resonant tunneling, the influence from polarization effects was analyzed and a way to restrain it on the NDR characteristic was found. Since the polarization field is along the negative C crystal orientation, while the external applied field is orthogonal to the original… Show more

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Cited by 3 publications
(7 citation statements)
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“…As can be seen in Fig. 4, the simulated electric field distributions of the proposed device samples at different bias voltage are in accordance to Equation (5). The peak field at the emitter spacer-GaN barrier interface and the exponential electric field distribution in emitter spacer region are attributed to both the accumulation of electrons and existence of polarization field at bias voltages.…”
Section: Electric Characteristics Of the Proposed Gan/ingan/algan-bas...supporting
confidence: 68%
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“…As can be seen in Fig. 4, the simulated electric field distributions of the proposed device samples at different bias voltage are in accordance to Equation (5). The peak field at the emitter spacer-GaN barrier interface and the exponential electric field distribution in emitter spacer region are attributed to both the accumulation of electrons and existence of polarization field at bias voltages.…”
Section: Electric Characteristics Of the Proposed Gan/ingan/algan-bas...supporting
confidence: 68%
“…Fig.4, Equation(5) and Equation (6) also indicate that most part of bias voltage drops across the collector spacer region when it is thick enough. Moreover, the thickness of the collector spacer region Wcs has important impact on the current-voltage characteristic of the proposed RTD as illustrated in Fig.5by taking sample 2 for example.…”
mentioning
confidence: 86%
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“…Accompanying the development of III-nitrides materials and devices, increasing attention has been paid to the GaNbased resonate tunneling diode (RTD) because of its excellent properties such as wider direct band gap, larger band offset, higher peak electron velocity, higher critical breakdown voltage and higher thermal stability than those of GaAs/Al-GaAs and Si/GeSi counterparts [1][2][3][4][5][6][7][8][9][10] . In particular, conduction band offsets in the InGaN/AlGaN system are larger than those in the InGaAs/AlGaAs system and a built-in electric field exists owing to the piezoelectric polarization effects, the former appeared to have very interesting negative differential resistance (NDR) related properties and became considerably attractive during the last decade [1, 3-5, 7, 8, 10] .…”
Section: Introductionmentioning
confidence: 99%