2005
DOI: 10.1111/j.1460-2695.2005.00951.x
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A review of deformation and fatigue of metals at small size scales

Abstract: A B S T R A C T Mechanical devices are being introduced whose size scale is well below that of conventional mechanical test specimens. The smallest devices have sizes in the nanometer range, though a good proportion of structural devices are of the micrometer scale. Development of these products raises the question of how their mechanical behaviour and reliability may be predicted. Conventional macroscopic test data can be used, but these are obtained using specimens whose size is much larger than the devices … Show more

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Cited by 95 publications
(48 citation statements)
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References 111 publications
(289 reference statements)
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“…on time-dependent deformation such as creep and fatigue [1]. It is known from literature that this behavior is affected by size-effects: the interaction between microstructural length scales and dimensional length scales [2,3]. Not much research has focused on characterizing size-effects in time-dependent material behavior, specifically for free-standing thin films [3].…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…on time-dependent deformation such as creep and fatigue [1]. It is known from literature that this behavior is affected by size-effects: the interaction between microstructural length scales and dimensional length scales [2,3]. Not much research has focused on characterizing size-effects in time-dependent material behavior, specifically for free-standing thin films [3].…”
Section: Discussionmentioning
confidence: 99%
“…It is known from literature that this behavior is affected by size-effects: the interaction between microstructural length scales and dimensional length scales [2,3]. Not much research has focused on characterizing size-effects in time-dependent material behavior, specifically for free-standing thin films [3]. This study investigates size-effects caused by grain statistics in timedependent deformation in µm-sized free-standing aluminum cantilever beams.…”
Section: Discussionmentioning
confidence: 99%
“…In the literature some reports can be found discussing creep and relaxation effects in thin aluminum films [3][4][5][6][7][8]. However, specifically for free-standing thin films not much research has focused on determining size-effects in time-dependent material behavior [9]. Therefore, there is a clear need for detailed studies into the physical micro-mechanisms underlying the size-effects in creep in metallic MEMS.…”
Section: Introductionmentioning
confidence: 99%
“…However, specifically for free-standing thin films not much research has focused on determining size-effects in time-dependent material behavior [12]. Therefore, there is a clear need for detailed studies into the physical micro-mechanisms underlying the size-effects in creep in metallic MEMS.…”
Section: Figure 1: Scanning Electron Micrograph Of An Rf-mems Switch mentioning
confidence: 99%