A review of typical properties of indium-tin oxide films.

Haranou, Takeshi; Takaki, S.

doi:10.4139/sfj.40.666

Cited by 6 publications

(1 citation statement)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…owing to the resonance phenomenon brought about by free electrons in it. 9) On the other hand, as shown in Fig. 9(a), these whisker coatings showed transmission loss mainly due to scattering brought about by the whisker structure (loss ¼ 100 À Tr À Rf) and markedly scattered infrared light of wavelength longer than 1.5 mm because the size of whisker structures is the same as the wavelength of infrared light.…”

Section: Discussionmentioning

confidence: 94%

Fabrication of Indium Tin Oxide Whiskers by Sputtering

Takaki

Aoshima

Satoh

2006

jjap

Self Cite

View full text Add to dashboard Cite

Whisker crystals and whisker structures have many possibilities for industrial applications because of their unique shape with high aspect ratios. However, their fabrication methods need a high-temperature process and a limited substrate, thereby limiting their applications. Therefore, a new fabrication method that can prepare whiskers at low cost and directly on a versatile substrate, such as a glass substrate, is required. We found that indium tin oxide coatings with well-developed whisker structures could be prepared on glass substrates heated at 300 C using conventional DC magnetron sputtering. These whisker coatings consist of continuous underlayer and upper structures with many whiskers. Each whisker is 500 nm to 1 mm in length and 10 to 20 nm in diameter. We revealed that the whisker structures were well grown under low-oxygen sputtering conditions and these whisker coatings could be categorized into three types of whisker morphology by scanning electron microscopy (SEM) observation and X-ray diffraction analysis (XRD). Whisker coatings of the first type have many needle structures and are strongly oriented along the h222i axis normal to the substrate. Whisker coating of the second type are increasingly oriented along the h400i axis and show a structure consisting of many trunks with side branches like similar to fir tree. Whisker coatings of the last type are equally oriented along h222i and h400i axes and have many fish-bone-like whisker structures. These whisker coatings may offer many possibilities for industrial applications, for example, emitter material for field-emission displays, and surface structures for super-hydrophilic or super-hydrophobic surfaces.

show abstract

Section: Discussionmentioning

confidence: 94%

Fabrication of Indium Tin Oxide Whiskers by Sputtering

Takaki

Aoshima

Satoh

2006

jjap

Self Cite

View full text Add to dashboard Cite

show abstract

Silver‐Nanowire/Graphene Stacked Transparent Electrodes and Its Application to Flexible Thin Film Photovoltaic Device

Akasaka,

Noguchi,

Kobayashi

2025

Electrical Engineering Japan

View full text Add to dashboard Cite

In this study, silver nanowire covered with graphene (AgNW/Graphene) transparent conducting electrodes (TCE) were developed as bendable TCE instead of conventionally used indium tin oxide (ITO) for flexible photovoltaic applications. CVD‐grown graphene films were transferred from a Cu foil onto a spin‐coated AgNW TCE. AgNW/Graphene TCE exhibited lower electrical resistance than 10 Ω and high optical transmission of approximately 80% at visible wavelengths before and after bending of 20 cycles at a radius of 15 mm. Thermal tolerance of AgNW was drastically improved by protecting silver nanowires with graphene from oxidation at the 300°C air annealing test. ZnMgO/Se thin film photovoltaic devices with AgNW/graphene were successfully demonstrated by insertion of a sol‐gel ZnO buffer layer in order to protect AgNW/graphene from sputtering bombardment.

show abstract

Sputtering Deposition With Low Cost Multi-Element Powder Targets

Ohshima

2023

IEEE Open J. Nanotechnol.

View full text Add to dashboard Cite

Compared to solid target, powder target is low cost and can be varied in wide range of elemental combinations. Transparent and conductive aluminum-doped zinc oxide (AZO) thin films were prepared by sputter deposition using a mixed powder target consisting of zinc oxide and aluminum oxide powders at 98:2 wt%. The bulk density of the powder target can be varied depending on the pressing pressure. Therefore, AZO thin films were prepared on Si and sapphire substrates using powder targets with different bulk densities (ρpowder) ranging from 0.898 to 3.00 g/cm 3 . The fabricated structural, electrical, and optical properties of the AZO thin films were examined, and the relationships between the target bulk density and film properties were investigated. X-ray diffraction measurements revealed c-axis ZnO (002) diffraction peaks, corresponding to crystallite growth oriented perpendicular to the substrate. Hall effect measurements showed n-type conductivity, with carrier density and Hall mobility increasing as the bulk density of the powder target increased. At ρpowder = 3.00 g/cm 3 , the AZO thin film on the Si substrate showed the lowest resistivity of 1.35×10 -3 Ω•cm. UV-visible spectroscopy measurements showed that the average transmittance in the visible light region exceeded 80% for the AZO thin films on the sapphire substrates. The figure of merit was calculated as a measure of the potential application in optoelectronic devices, resulting in 6.37×10 -3 Ω -1 for ρpowder = 3.00 g/cm 3 . This research contributes to Nagasaki University's goal of "planetary health".

show abstract

A review of typical properties of indium-tin oxide films.

Cited by 6 publications

References 0 publications

Fabrication of Indium Tin Oxide Whiskers by Sputtering

Fabrication of Indium Tin Oxide Whiskers by Sputtering

Silver‐Nanowire/Graphene Stacked Transparent Electrodes and Its Application to Flexible Thin Film Photovoltaic Device

Sputtering Deposition With Low Cost Multi-Element Powder Targets

Contact Info

Product

Resources

About