2013
DOI: 10.1088/1742-6596/443/1/012003
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A simple shape-free model for pore-size estimation with positron annihilation lifetime spectroscopy

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Cited by 46 publications
(63 citation statements)
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“…The wellestablished technique of employing radionuclides simultaneously emitting gamma-rays and positrons of typically up to several hundreds of keV is widely applied. Annihilation lifetimes are monotonously related to the void size with a surprisingly low dependence on the material surrounding the void [1]. The quantitative determination of positron annihilation lifetimes nevertheless is hampered when thin films or layered structures with sub-µm thicknesses which are of high technological relevance are considered.…”
Section: Introductionmentioning
confidence: 99%
“…The wellestablished technique of employing radionuclides simultaneously emitting gamma-rays and positrons of typically up to several hundreds of keV is widely applied. Annihilation lifetimes are monotonously related to the void size with a surprisingly low dependence on the material surrounding the void [1]. The quantitative determination of positron annihilation lifetimes nevertheless is hampered when thin films or layered structures with sub-µm thicknesses which are of high technological relevance are considered.…”
Section: Introductionmentioning
confidence: 99%
“…A positive correlation between the o-Ps lifetime and cavity size is well-proven and several semi-empirical relations between o-Ps lifetime and cavity size parameters have been proposed to date [16][17][18][19][20][21][22]. In the present paper, we make use of a simple shapefree model suggested recently by Wada and Hyodo [22] for pore size estimation using experimental oPs lifetimes. In their model, the primary measure of pore size is the mean free length of the pore,L, which can be eventually transformed into radius R of a spherical pore as L = 4R/3.…”
Section: Resultsmentioning
confidence: 96%
“…In their model, the primary measure of pore size is the mean free length of the pore,L, which can be eventually transformed into radius R of a spherical pore as L = 4R/3. In what follows, the pore size is expressed in terms of pore radius R estimated from the present oPs lifetime data using the Wada and Hyodo formula [22]. Since the present PLT measurements were conducted in air, a correction of the experimental lifetimes due to the ortho-para quenching of o-Ps was applied.…”
Section: Resultsmentioning
confidence: 99%
“…we assume that at t = 0 the positrons are uniformly distributed and there are no positrons trapped at interfacial defects and nanovoids. Thus, the diffusion equation is solved subjected to the boundary conditions: where V  is the volume of the grain having radius R. Thus, we obtain the solution of equation (1). When a beam of monoenergetic positrons is implanted from vacuum into the grain, the positron survives before annihilation either as a free positron or trapped at the grain boundary or into the thermally induced vacancy.…”
Section: Formulation Of the Diffusion Trapping Modelmentioning
confidence: 99%
“…While the annihilation lifetime yields characteristic information about the size of open-volume defects ranging from single atomic vacancies up to nanovoids, the kinematical Doppler-broadening of annihilation radiation tells about the local electron momentum distribution at the annihilation site. Annihilation lifetimes are monotonously related to the void size with a surprisingly low dependence on the material surrounding the void [1]. The semiconducting nanocrystalline thin films have great applications in electronic industry, solar cells, solar energy storage and biomedical industries.…”
Section: Introductionmentioning
confidence: 99%