A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations

Sakar, Baha; Sievers, S.; Scarioni, Alexander Fernández; García‐Sánchez, Felipe; Öztoprak, İlker; Schumacher, H. W.; Öztürk, Osman

doi:10.3390/magnetochemistry7060078

Cited by 5 publications

(5 citation statements)

References 45 publications

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“…For this, ∂ H n /∂n has to be calculated from the measured magnetization pattern of the calibration sample. A class of relevant candidate calibration samples are multilayer magnetic thin films with strong PMA such as Cu/Ni/Cu trilayers [5,15], Co/Pd multilayers [33], Co/Pt multilayers [20,[42][43][44], and Ti/Co/Pt multilayer stacks [22]. Such materials form domains with up and down magnetic moment orientations in demagnetized state, such that ∂ H n /∂n can be calculated with the addition of a Bloch-type DW profile.…”

Section: Mfm Tip Calibration With High-resolution Datamentioning

confidence: 99%

“…In this way, the corresponding calibration of the tip will be suitable for the quantification of a MFM measurement performed on the selected target sample. For tip-calibration procedures performed with MFM data acquired under ambient conditions, i.e., with a low Q-factor cantilever and thus with a limited measurement sensitivity, samples with a hundred bilayers are typically used to provide a sufficiently large signal [20,22]. The domain size of such a sample is typically around 200 nm, limiting the calibration to wavelengths smaller than 400 nm.…”

Section: Mfm Tip Calibration With High-resolution Datamentioning

confidence: 99%

“…In particular, MFM proves to be a reliable and adequate tool for imaging room-temperature magnetic skyrmions [11,12], which are of great interest due to their potential application in future-generation storage devices [13,14]. Following our early work on a quantification of the MFM tip response [15], and various applications thereof [16][17][18], there is growing interest in the development of improved MFM tip calibration and quantitative magnetic field measurement procedures [19][20][21][22][23][24].…”

Section: Introductionmentioning

confidence: 99%

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Quantitative Magnetic Force Microscopy: Transfer-Function Method Revisited

Feng

Mandru²,

Yıldırım³

et al. 2022

Phys. Rev. Applied

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Magnetic force microscopy (MFM) is a characterization method used to obtain images of the stray field emanating from the surface of magnetic samples with high spatial resolution. The MFM signal arises from a convolution of the magnetic moment distribution of the MFM tip with the stray field of the sample. Therefore, deconvolution of the stray field of a magnetic sample requires a well-defined micromagnetic structure of a tip. While the magnetic moment distribution of the tip remains challenging to assess, it is convenient to calibrate the tip-equivalent magnetic charge in a plane parallel to the sample surface running through the tip apex using a suitable tip-calibration method. Once the tip-equivalent magnetic charge is calibrated, MFM data can be deconvolved to obtain the stray field of the sample or the equivalent magnetic surface charge, for example, at the sample surface. Here we use low-noise MFM data obtained with highquality-factor cantilevers and a modified L-curve method for the optimization of a Tikhonov deconvolution procedure used for the calibration of the MFM tip, and-once the tip is calibrated-for obtaining the stray field or magnetic surface charge of the sample.

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Section: Mfm Tip Calibration With High-resolution Datamentioning

confidence: 99%

Section: Mfm Tip Calibration With High-resolution Datamentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Quantitative Magnetic Force Microscopy: Transfer-Function Method Revisited

Feng

Mandru²,

Yıldırım³

et al. 2022

Phys. Rev. Applied

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“…Some of the production parameters are the deposition rate [2], the different temperatures of the substrate [5], and the value of the layer thicknesses [6,7]. Cobalt is frequently used in applications where electrical, mechanical and magnetic properties are prominent and also investigated by many researchers to explore its various physical properties [8][9][10]. In a study by Tomlinson et al in 1992 [11], magnetotransport and structural features were examined in Co/Cu multilayered structures produced with high vacuum technique and the differences between the measurements of as-deposited and as-annealed were reported.…”

Section: Introductionmentioning

confidence: 99%

Investigation of the effects of Cu layer thickness and annealing temperature under air atmosphere on the properties of Co/Cu multilayer films

Karpuz,

Köçkar,

Kaplan

2023

Phys. Scr.

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Co/Cu films were deposited by the sputtering technique. The effects of different thicknesses of non-magnetic (Cu) layers and annealing temperature on magneto-structural properties were investigated. Different thicknesses of Cu layers were determined as 34 nm, 10 nm, 4 nm. Additionally, two annealed situations were considered to investigate the annealing effect. While the first one is exposing the films to 80 oC and 130 oC for 240 s, second one is annealing the films at 180 oC for different exposure times (50 s and 150 s). All films that have different thicknesses of Cu layers crystallized in (111) plane of the face centered cubic (fcc) structure. The intensity of this peak increased with increasing Cu layers thickness. Variation in the thickness of Cu layers has an important effect on the film surface. Saturation magnetization (Ms), coercivity (Hc) and squareness (Mr/Ms, Mr: remanent magnetization) were considerably affected by variation of the Cu content and film surface caused by the change in the thickness of the Cu layers. The film with 4 nm Cu layer thickness has the highest Ms, lowest Hc values and high Mr/Ms ratio. This indicates magnetically high efficient compared to the other films in the same series. The fcc structure continued to exist for the films annealed at 80 oC and 130 oC for 240 s. It was found that the annealing procedure transfigured the film surface and the differences in Ms and Hc values can be mostly attributed to this transfiguration because of the same film content revealed. An increase in Ms value, and a slight decrease in Hc and Mr/Ms values were detected for the annealed film at 130 oC, compared to the film annealed at 80 oC. It was also seen that the film structure was damaged at 180 oC because of excessive heat transfer.

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“…The third contribution, "A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations", by Baha Sakar, Sibylle Sievers, Alexander Fernández Scarioni, Felipe García-Sanchez, Ilker Öztoprak, Hans Werner Schumacher and Osman OÅNztürk of Gebze Technical University, Physikalisch-Technische Bundesanstalt and the University of Salamanca [3], presents the use of magnetic force microscopy (MFM) and the instrument calibration function (ICF). As the quality of the calibration depends critically on the calculability of the magnetization distribution of the reference sample, they discussed the use of a Ti/Pt/Co multilayer stack showing stripe domain pattern as a suitable reference material.…”

mentioning

confidence: 99%