2011
DOI: 10.1039/c1ja10043b
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A ToF-SIMS study of the deuterium—hydrogen exchange induced by ammonia plasma treatment of polyolefins

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Cited by 18 publications
(12 citation statements)
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“…Polyethylene and polypropylene foils were measured with XPS and ToF-SIMS as described in part 1 [46]. Additionally, C, H, N-analysis and 1 H and 2 H-NMR were performed.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Polyethylene and polypropylene foils were measured with XPS and ToF-SIMS as described in part 1 [46]. Additionally, C, H, N-analysis and 1 H and 2 H-NMR were performed.…”
Section: Methodsmentioning
confidence: 99%
“…deuterated polyethylene (d-PE) foils exposed to ammonia plasma was obtained from ToF-SIMS analysis (for details see [46]). The introduction of N-functionalities was also studied by this approach.…”
Section: Specific Information On H-d Exchange In Polypropylene (H-pp)mentioning
confidence: 99%
“…This issue is illustrated in Figure with the peak at m/z 30.043, whose possible identifications are C 2 DH 4 + , C 2 D 2 H 2 + , and C 2 D 3 + because of the uncertainty on the H isotope content. The most probable structure for the ion is considered the one containing the lowest number of deuterium atoms . Second, the intensities of the characteristic molecular fragment ions of the pristine polymer, such as C 2 H 5 + , C 3 H 5 + , C 3 H 7 + , C 4 H 7 + , and C 4 H 9 + , decrease in the treated PEs.…”
Section: Resultsmentioning
confidence: 99%
“…In that investigation, H 2 O was replaced by D 2 O in order to discriminate the H contributions coming from the polymer itself and the atmospheric moisture from the water deliberately mixed to the plasmogen gas. This approach exploited the high sensitivity and selectivity of the SIMS technique for the detection of H isotopes contained in molecular ion fragments present in the outermost layer of the specimen, a capability that is out of reach of XPS . The H‐D exchange in the surface region was thoroughly studied.…”
Section: Introductionmentioning
confidence: 99%
“…ToF–SIMS was chosen for the surface and in‐depth analysis because it is the only surface technique possessing sufficient sensitivity and selectivity to the hydrogen isotopes as elements and in molecular fragments . This capability has been already exploited in surface studies of deuterated or H–D exchanged polymer surfaces, where the group of Friedrich and Unger modified PE and deuterated PE using low pressure NH 3 and ND 3 plasma, but not upon molecular depth‐profiling. Here, capitalizing on the advent of Ar cluster ion beams for sample sputtering, the modifications of the polymer molecular structure will also be followed along the sample depth .…”
Section: Introductionmentioning
confidence: 99%