A transient noise model for frequency-dependent noise sources

Sung, Joon-Jea; Kang, Guen-Soon; Kim, Suki

doi:10.1109/tcad.2003.814956

Cited by 14 publications

(2 citation statements)

References 3 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Shot, flicker and resistive thermal noise are observed in Zener diodes. [9][10][11] The time domain transient noise characteristics of the Zener diode compact model are determined by the properties of current noise sources Insz, Infz, Insf, Inff, InRz and InRf. These are represented by the RMS values given by Equations ( 8)-( 13)…”

Section: The Transient Noise Modelmentioning

confidence: 99%

Modelling and simulation of Zener diode noise in the time domain

Brinson

2023

Int J Numerical Modelling

View full text Add to dashboard Cite

This paper presents a new time domain Zener diode compact model for transient noise simulation. SPICE2 and SPIC3 use piece‐wise linear time dependent sources for generating complex waveforms. This approach is not practical when applied to randomly generated noise. Today, through on‐going improvements to freely available circuit simulation tools, SPICE noise generation has moved to a new level. Ngspice, for example, computes white Gaussian noise ‘on‐the‐fly’ as transient simulation progresses. The proposed model has a simple behavioural structure that supports time domain shot, flicker, and thermal noise. The physical properties of the proposed model are introduced in the second section. This is followed by an evaluation of model performance in the third and fourth sections, including static d.c, dynamic charge, and transient noise characterisation. Finally, the fifth section summarises the conclusions of the research.

show abstract

Section: The Transient Noise Modelmentioning

confidence: 99%

Modelling and simulation of Zener diode noise in the time domain

Brinson

2023

Int J Numerical Modelling

View full text Add to dashboard Cite

show abstract

“…First, it seemed reasonable to check the transient noise (TN) circuit simulation module of Spectre with a Cadence 28 nm FDSOI Design Kit. Details of this simulation process can be found elsewhere [10,11]. This method generates time-domain current fluctuations according to the device noise level that has been declared in the model.…”

Section: Simulation Approachesmentioning

confidence: 99%