A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults

Test Generation for Open Defects in CMOS Circuits

“…The sizes of the proposed test set can also be compared to test sets that detect all detectable TDF and TSOP faults. Such a test set, while providing the same coverage of open defects as the proposed test set, requires many additional test patterns as we reported in [19]. For example, for broadside method, on an average, such a test set contains 14.68% additional test patterns than the proposed test set.…”

“…While the percentage of additional test patterns in the proposed test set is higher for these methods, the proportion of detectable TSOP faults that are not detected by TDF tests is also much higher compared to the broadside method. It should be noted that the size of the proposed test set may be further reduced if the TSOP fault test patterns are directly generated using an enhanced ATPG program instead of the circuit transformations method [19] that was used in these experiments. The sizes of the proposed test set can also be compared to test sets that detect all detectable TDF and TSOP faults.…”

“…In all our experiments, only the faults in the combinational logic part of the circuit are considered and all the results are reported in terms of collapsed faults. The experiments were performed using a commercial ATPG tool and we used the circuit transformation approach [19] for generating the TSOP fault test patterns.…”

“…Such an enhancement, though trivial, may not be feasible if the source code for the TDF ATPG is not available. In such cases an alternative approach we proposed in [19] can be used. In this approach, multiple gate level transformations of the circuit under test are obtained, and for each transformed circuit test patterns are generated for a subset of TDFs using a conventional TDF ATPG program.…”

“…Moreover the tests also create a transition at the gate output and hence they are SOE-TDF tests. In this paper we do not describe the complete procedure for obtaining the TSOP test patterns using this approach since a detailed discussion of this method can be found in [19].…”