A Universal Formula for the Secondary Electron Yield of Metals at an Incident Angle of θ

Xie, Ai-Gen; Zhang, Jian; Wang, Tie-Bang

doi:10.1088/0256-307x/28/9/097901

Cited by 10 publications

(4 citation statements)

References 20 publications

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“…The b coefficient was taken to be 2[cos(h)] 1.35 after Xie et al 48 In order to evaluate and quantify the role of secondary emission on the microwave response of a magnetron, computer simulations were performed using the PIC code MAGIC. 49 For the PIC simulations, the well-known A6 magnetron 50 was chosen with the anode block consisting of 6 sectorial 20 cavities with length L ¼ 7.2 cm, maximum radius R cav ¼ 4.11 cm, and minimum radius R a ¼ 2.11 cm.…”

Section: Model and Methodsmentioning

confidence: 99%

Assessing the role of secondary electron emission on the characteristics of 6-cavity magnetrons with transparent cathode through particle-in-cell simulations

Qiu

Prasad

Ludeking³

et al. 2014

Journal of Applied Physics

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Effects of secondary electron emission (SEE) on the performance of a 6-cavity relativistic magnetron with transparent cathodes are probed through particle-in-cell simulations. Appropriate relations for the secondary electron yield have been developed and used. For comparisons, separate simulations have been performed with- and without electron cascading. Simulation results seem to indicate SEE to be detrimental to the power output due to deviations in the starting trajectories of secondary electrons, and the reduced fraction with synchronized rotational velocity. A higher reduction in output power is predicted with electron cascading, though mode competition was not seen at the 0.65 T field. A possible solution to mitigating SEE in magnetrons for high power microwave applications would be to alter the surface properties of emitting electrodes through irradiation, which can lead to graphitic film formation.

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Section: Model and Methodsmentioning

confidence: 99%

Assessing the role of secondary electron emission on the characteristics of 6-cavity magnetrons with transparent cathode through particle-in-cell simulations

Qiu

Prasad

Ludeking³

et al. 2014

Journal of Applied Physics

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“…For a secondary electron emitter, 𝐵 is a constant and is not a function of the incident energy of primary electrons. [1,2,[4][5][6]15,19] Therefore, Eq. ( 18) for 𝐵 deduced under the condition that primary electrons at a high electron energy hit on insulators is universal for the estimation of 𝐵 under the condition that primary electrons at any energy hit on insulators.…”

Section: Top Of Valence Bandmentioning

confidence: 99%

Formula for the Probability of Secondary Electrons Passing over the Surface Barrier into a Vacuum

Xie¹,

Xiao²,

Zhan³

et al. 2012

Chinese Phys. Lett.

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Based on a simple classical model that primary electrons at high electron energy interact with the electrons of lattice by the Coulomb force, we deduce the energy of secondary electrons. In addition, the number of secondary electrons in the direction of velocity of primary electrons per unit path length, 𝑛, is obtained. According to the energy band of the insulator, 𝑛, the definition of the probability 𝐵 of secondary electrons passing over the surface barrier of insulator into the vacuum and the assumption that lattice scattering is ignored, we deduce the expression of 𝐵 related to the width of the forbidden band (𝐸𝑔) and the electron affinity 𝜒. As a whole, the 𝐵 values calculated with the formula agree well with the experimental data. The calculated 𝐵 values lie between zero and unity and are discussed theoretically. Finally, we conclude that the deduced formula and the theory that explains the relationships among 𝐵, 𝜒 and 𝐸𝑔 are correct.

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“…High-power microwave components are one of the core payloads in spacecrafts and satellites. [1][2][3][4] However, the multipactor effects become more and more destructive in space as the microwave devices become miniaturized and integrated. The multipactor effects can increase the surface temperature of microwave components and the noise level of the microwave devices which decreases the output power levels.…”

Section: Introductionmentioning

confidence: 99%

Effect of Cu doping on the secondary electron yield of carbon films on Ag-plated aluminum alloy

Hu¹,

Zhu²,

Zhao³

et al. 2022

Chinese Phys. B

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Reducing the secondary electron yield (SEY) of Ag-plated aluminum alloy is important for high-power microwave components. In this work, Cu doped carbon films are prepared and the secondary electron emission characteristics are studied systematically. The secondary electron coefficient δ max of carbon films increases with the Cu contents increasing at first, and then decreases to 1.53 at a high doping ratio of 0.645. From the viewpoint of surface structure, the higher the content of Cu is, the rougher the surface is, since more cluster particles appear on the surface due to the small solid solubility of Cu in the amorphous carbon network. However, from viewpoint of the electronic structure, the reduction of the sp2 hybrid bonds will increase the SEY effect as the content of Cu increases, due to the decreasing probability of collision with free electrons. Thus, the two mechanisms would compete and coexist to affect the SEY characteristics in Cu doped carbon films.

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A Universal Formula for the Secondary Electron Yield of Metals at an Incident Angle of θ

Cited by 10 publications

References 20 publications

Assessing the role of secondary electron emission on the characteristics of 6-cavity magnetrons with transparent cathode through particle-in-cell simulations

Assessing the role of secondary electron emission on the characteristics of 6-cavity magnetrons with transparent cathode through particle-in-cell simulations

Formula for the Probability of Secondary Electrons Passing over the Surface Barrier into a Vacuum

Effect of Cu doping on the secondary electron yield of carbon films on Ag-plated aluminum alloy

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