A versatile ion beam spectrometer for studies of ion interaction with 2D materials

Abstract

We present an ultrahigh vacuum setup for ion spectroscopy of freestanding two-dimensional solid targets. An ion beam of different ion species (e.g., Xe with charge states from 1 to 44 and Ar with charge states from 1 to 18) and kinetic energies ranging from a few 10 eV to 400 keV is produced in an electron beam ion source. Ions are detected after their transmission through the 2D target with a position sensitive microchannel plate detector allowing the determination of the ion's exit charge state as well as the scattering angle with a resolution of approximately 0.04°. Furthermore, the spectrometer is mounted on a swiveling frame covering a scattering angle of ±8° with respect to the incoming beam direction. By utilizing a beam chopper, we measure the time-of-flight of the projectiles and determine the energy loss when passing a 2D target with an energy uncertainty of about 2%. Additional detectors are mounted close to the target to observe emitted secondary particles and are read-out in coincidence with the position and time information of the ion detector. A signal in these detectors can also be used as a start trigger for time-of-flight measurements, which then yield an energy resolution of 1% and an approximately 1000-fold larger duty cycle. First results on the interaction of slow Xe ions with a freestanding single layer of graphene obtained with the new setup are compared to recently published data where charge exchange and energy were measured by means of an electrostatic analyzer.

Surface modification of multilayer FePS3 by Ga ion irradiation

“…Due to its higher in-plane stiffness and lower cleavage energies than graphite, the bulk structure of FePS 3 could be exfoliated down to the atomic thickness. Consequently, the technique of ion beam modification to achieve desired properties of various materials has been rapidly developed 10–14 . There are three effects of ion beam irradiation on 2D materials: doping effect, structural modification and defect engineering 15,16 .…”

Vanishing influence of the band gap on the charge exchange of slow highly charged ions in freestanding single-layer MoS2

“…For that, measurements were performed at TU Wien using the setup as described in Ref. [23] and at the Ion Beam Center of the Helmholtz-Zentrum Dresden-Rossendorf (HZDR) [24]. Charge exchange of highly charged xenon ions through MoS 2 monolayers [Fig.…”

Neutralization Dynamics of Slow Highly Charged Ions in 2D Materials

“…The target chamber is kept at low 10 −9 mbar or high 10 −10 mbar to prevent charge exchange of the ions with the rest gas as well as keeping the samples free of contaminations as good as possible. Details in the experimental setups can be found in [24,46].…”

“…Using a different detection technique, i.e., a multi-channel plate with a delay-line detector (DLD), enables a two-dimensional position determination of transmitted ions (see Figure 4e) [24]. Limiting the scattering angle in one direction (vertical) with a slit aperture and using a set of deflection plates, we can resolve both, charge exchange and scattering angle, at the same time for all transmitted charge states (including neutral atoms) in parallel.…”

“…Here, we review recent work on HCI irradiation of 2D materials, which is a young subfield of ion-solid interaction. As there exists only a limited body of research and many groups are currently joining the field, we focus mainly on our own work over the last five years [2,[18][19][20][21][22][23][24] with the aim to give an overview for newcomers.…”