Pyroxenes ((Ca, Mg, Fe, Mn) 2 Si 2 O 6 ) belong to the most abundant rockforming minerals that make up the surface of rocky planets and moons. Therefore sputtering of pyroxenes by solar wind ions has to be considered as a very important process for modifying the surface of planetary bodies. In order to quantify this effect, sputtering of wollastonite (CaSiO 3 ) by He 2+ ions, which are seen as a very prominent contribution to solar wind potential sputtering, was investigated. Thin films of CaSiO 3 deposited on a quartz crystal microbalance were irradiated allowing precise in-situ real time sputtering yield measurements. Experimental results were compared with simulations with the code SDTrimSP, which were improved by adapting the used surface binding energy.On a freshly prepared surface He 2+ ions show a significant increase in sputtering compared to equally fast He + ions. The yield, however, decreases exponentially with fluence, reaching steady state at considerably lower values after sputtering of the first few monolayers.Experiments using Ar 8+ ions show a similar behavior and are qualitatively explained by a preferential depletion of surface oxygen due to potential sputtering. A corresponding quantitative model is applied, which is able to reproduce the observed potential sputtering behavior of both He and Ar very well. The results of these calculations support the assumption that mainly O atoms are affected by potential sputtering. We conclude that the defect-mediated model of potential sputtering is also well-suited for CaSiO 3 .

Low-energy electrons (LEEs) are of great relevance for ion-induced radiation damage in cells and genes. We show that charge exchange of ions leads to LEE emission upon impact on condensed matter. By using a graphene monolayer as a simple model system for condensed organic matter and utilizing slow highly charged ions (HCIs) as projectiles, we highlight the importance of charge exchange alone for LEE emission. We find a large number of ejected electrons resulting from individual ion impacts (up to 80 electrons/ion for Xe40+). More than 90% of emitted electrons have energies well below 15 eV. This “splash” of low-energy electrons is interpreted as the consequence of ion deexcitation via an interatomic Coulombic decay (ICD) process.

The growing family of 2D materials led not long ago to combining different 2D layers and building artificial systems in the form of van der Waals heterostructures. Tailoring of heterostructure properties postgrowth would greatly benefit from a modification technique with a monolayer precision. However, appropriate techniques for material modification with this precision are still missing. To achieve such control, slow highly charged ions appear ideal as they carry high amounts of potential energy, which is released rapidly upon ion neutralization at the position of the ion. The resulting potential energy deposition is thus limited to just a few atomic layers (in contrast to the kinetic energy deposition). Here, we irradiated a freestanding van der Waals MoS 2 /graphene heterostructure with 1.3 keV/amu xenon ions in high charge states of 38, which led to nanometer-sized pores that appear only in the MoS 2 facing the ion beam, but not in graphene beneath the hole. Reversing the stacking order leaves both layers undamaged, which we attribute to the high conductivity and carrier mobility in graphene acting as a shield for the MoS 2 underneath. Our main focus is here on monolayer MoS 2 , but we also analyzed areas with few-layer structures and observed that the perforation is limited to the two topmost MoS 2 layers, whereas deeper layers remain intact. Our results demonstrate that in addition to already being a valuable tool for materials processing, the usability of ion irradiation can be extended to mono- (or bi)layer manipulation of van der Waals heterostructures when the localized potential energy deposition of highly charged ions is also added to the toolbox.

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We present an ultrahigh vacuum setup for ion spectroscopy of freestanding two-dimensional solid targets. An ion beam of different ion species (e.g., Xe with charge states from 1 to 44 and Ar with charge states from 1 to 18) and kinetic energies ranging from a few 10 eV to 400 keV is produced in an electron beam ion source. Ions are detected after their transmission through the 2D target with a position sensitive microchannel plate detector allowing the determination of the ion's exit charge state as well as the scattering angle with a resolution of approximately 0.04°. Furthermore, the spectrometer is mounted on a swiveling frame covering a scattering angle of ±8° with respect to the incoming beam direction. By utilizing a beam chopper, we measure the time-of-flight of the projectiles and determine the energy loss when passing a 2D target with an energy uncertainty of about 2%. Additional detectors are mounted close to the target to observe emitted secondary particles and are read-out in coincidence with the position and time information of the ion detector. A signal in these detectors can also be used as a start trigger for time-of-flight measurements, which then yield an energy resolution of 1% and an approximately 1000-fold larger duty cycle. First results on the interaction of slow Xe ions with a freestanding single layer of graphene obtained with the new setup are compared to recently published data where charge exchange and energy were measured by means of an electrostatic analyzer.