2012
DOI: 10.1109/tmtt.2012.2223229
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A Wideband RF Power Amplifier in 45-nm CMOS SOI Technology With Substrate Transferred to AlN

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Cited by 19 publications
(10 citation statements)
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“…The total phase differences for feeding from bottom and top can be calculated according to θ total−n = out−n ± θ in−n (23) where θ total−n is the total phase difference, out−n is the overall output phase of the stack [see (19)], and θ in−n is the overall input phase of the stack [see (22)]. The plus sign represents the feeding from the top while the minus sign represents the feeding from the bottom.…”
Section: Feeding Effectmentioning
confidence: 99%
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“…The total phase differences for feeding from bottom and top can be calculated according to θ total−n = out−n ± θ in−n (23) where θ total−n is the total phase difference, out−n is the overall output phase of the stack [see (19)], and θ in−n is the overall input phase of the stack [see (22)]. The plus sign represents the feeding from the top while the minus sign represents the feeding from the bottom.…”
Section: Feeding Effectmentioning
confidence: 99%
“…Both PAs are designed based on triple Casecode cells with a bottom feed configuration. The first PA is designed for K-band/5G applications (20)(21)(22)(23)(24)(25)(26)(27)(28)(29)(30), while the second PA is targeted at U-band (45-55 GHz) frequencies for ultrahigh-bandwidth communications. The CMOS SOI technology surrounds each transistor with buried and trench oxide, leading to electrically isolated transistors.…”
Section: Pa Circuit Designmentioning
confidence: 99%
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“…Therefore, those transistors are the ones that require attention (the possibility of breakdown if signal swing increases) because they have to withstand more voltage swings compared to the bottom transistors [45]. The overall voltage swing ( ) Vtotal can be expressed by the following equation for n stacked transistors [46]:…”
Section: The Effect Of Parasitic Capacitance On Stacked-transistor Pasmentioning
confidence: 99%
“…1,6,7 Such paths can limit the IC frequency response and power delivered to the load, giving rise to overloading conditions and eventually, the IC failure. 8 To identify them, an innovative and efficient solution is its local tracking through the IC under operation. In this regard, using off-chip thermal imaging systems (e.g., Infrared…”
mentioning
confidence: 99%