Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion

Sasaki, Y.; Machida, Kosuke; Aoki, Riho; Katayama, Shogo; Nakatani, Takayuki; Wang, Jianlong; Sato, Keno; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu; Kuwana, Anna; Hatayama, Kazumi; Kobayashi, Haruo

doi:10.1109/itc-asia.2019.00014

Cited by 8 publications

(3 citation statements)

References 1 publication

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“…5 AMS Circuit and System Testing Technologies AMS circuit and system testing technologies are important but their researchers are not so many in universities. Then we have been engaged in the research for them by collaborating with industry [109][110][111][112][113][114][115][116][117][118][119][120][121][122][123][124]. These are at the boundary between AMS circuit and LSI testing technologies.…”

Section: Mos Reference Current Sourcementioning

confidence: 99%

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How the Author's Group Came Up with Ideas in Analog/Mixed-Signal Circuit and System Area

KOBAYASHI

2024

IEICE Trans. Fundamentals

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This article reviews the author's group research achievements in analog/mixed-signal circuit and system area with introduction of how they came up with the ideas. Analog/mixed-signal circuits and systems have to be designed as well-balanced in many aspects, and coming up ideas needs some experiences and discussions with researchers. It is also heavily dependent on researchers. Here, the author's group own experiences are presented as well as their research motivations.

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Section: Mos Reference Current Sourcementioning

confidence: 99%

“…Both are for very small DC voltage measurement; one is that for analog IC related small voltage/current with DC-AC conversion (Fig. 42) [122,123,124] and the other is that for strain measurement using strain gauge (Fig. 43) [126].…”

Section: Dc-ac Conversion Technique For Very Small DC Voltagementioning

confidence: 99%

How the Author's Group Came Up with Ideas in Analog/Mixed-Signal Circuit and System Area

KOBAYASHI

2024

IEICE Trans. Fundamentals

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“…Due to recent demands for high reliability and low power of IoT systems, μV-order voltage and nA-order current in analog circuit need to be tested with good linearity at low cost [4,5]. There thermal effect or electric motive force (EMF) has to be taken care of for high precision measurement.…”

Section: Consideration On Thermal Effect For High Precision Analog Ic...mentioning

confidence: 99%

Innovative Practices Track: Innovative Analog Circuit Testing Technologies

Mangelsdorf¹,

Madhvaraj

Mir

et al. 2022

2022 IEEE 40th VLSI Test Symposium (VTS)

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Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers

Ogihara

Nakatani

Hatta

et al. 2020

2020 IEEE 29th Asian Test Symposium (ATS)

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Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion

Cited by 8 publications

References 1 publication

How the Author's Group Came Up with Ideas in Analog/Mixed-Signal Circuit and System Area

How the Author's Group Came Up with Ideas in Analog/Mixed-Signal Circuit and System Area

Innovative Practices Track: Innovative Analog Circuit Testing Technologies

Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers

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