Achieving high encoding efficiency with partial dynamic LFSR reseeding

Krishna, C. Vamsi; Jas, A.; Touba, N.A.

doi:10.1145/1027084.1027089

Cited by 25 publications

(9 citation statements)

References 12 publications

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“…These shortcomings are tackled by linear compression methods. The most widely adopted linear compression method is the reseeding of linear feedback shift registers (LFSRs) [16]- [18]. LFSR reseeding exploits the low fill rate of test cubes.…”

Section: T He Main Objective Of Test Data Compression (Tdc)mentioning

confidence: 99%

High-Quality Statistical Test Compression With Narrow ATE Interface

Tenentes

Kavousianos

2013

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

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Abstract-In this paper, we present a novel compression method and a low-cost decompression architecture that combine the advantages of both symbol-based and linear-based techniques and offer a very attractive unified solution that removes the barriers of existing test data compression techniques. Besides the traditional goals of high compression and short test application time, the proposed method also offers low shift switching activity and high unmodeled defect coverage at the same time. In addition, it favors multi-site testing as requires a very low pincount interface to the automatic test equipment. Finally, contrary to existing techniques, it provides an integrated solution for testing multi-core system on chips (SoCs) as it is suitable for cores of both known and unknown structures that usually coexist in SoCs.Index Terms-Defect-oriented testing, design for testability, dft, IP cores, low-power scan-based testing, multi-core SoC, selective Huffman, test data compression, unmodeled defect coverage.

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Section: T He Main Objective Of Test Data Compression (Tdc)mentioning

confidence: 99%

High-Quality Statistical Test Compression With Narrow ATE Interface

Tenentes

Kavousianos

2013

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

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“…The exemplary decompressor architecture used here is based on partial seeding, which injects a fixed amount of free variables into the LFSR in each shift cycle [19,20]. Figure 4 depicts the decompressor structure with two free variables fed into it in each cycle.…”

Section: A Partial Seedingmentioning

confidence: 99%

Test Encoding for Extreme Response Compaction

Kochte

Holst

Elm

et al. 2009

2009 14th IEEE European Test Symposium

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Optimizing bandwidth by compression and compaction always has to solve the trade-off between input bandwidth reduction and output bandwidth reduction. Recently it has been shown that splitting scan chains into shorter segments and compacting the shift data outputs into a single parity bit reduces the test response data to one bit per cycle without affecting fault coverage and diagnostic resolution if the compactor's structure is included into the ATPG process.This test data reduction at the output side comes with challenges at the input side. The bandwidth requirement grows due to the increased number of chains and due to a drastically decreased amount of don't care values in the test patterns.The paper at hand presents a new iterative approach to test set encoding which optimizes bandwidth on both input and output side while keeping the diagnostic resolution and fault coverage. Experiments with industrial designs demonstrate that test application time, test data volume and diagnostic resolution are improved at the same time and for most designs testing with a bandwidth of three bits per cycle is possible.

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“…The fully specified scan-in states of functional broadside tests are not compatible with the most popular test data compression methods [Barnhart et al 2001;Chandra et al 2011;Koenemann 1991;Krishna et al 2004;Lin and Rajski 2012;Pomeranz 2016;Rajski et al 2002;Sun et al 2004;Tenentes et al 2008]. These methods compress tests into initial states (seeds) for a linear-feedback shift register (LFSR).…”

Section: Introductionmentioning

confidence: 99%

Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside Tests

Pomeranz

2016

ACM Trans. Des. Autom. Electron. Syst.

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This article describes a procedure for test data compression targeting functional and partially functional broadside tests. The scan-in state of such a test is either a reachable state or has a known Hamming distance from a reachable state. Reachable states are fully specified, while the popular LFSR-based test data compression methods require the use of incompletely specified test cubes. The test data compression approach considered in this article is based on the use of periodic scan-in states. Such states require the storage of a period that can be significantly shorter than a scan-in state, thus providing test data compression. The procedure computes a set of periods that is sufficient for detecting all the detectable target faults. Considering the scan-in states that the periods produce, the procedure ranks the periods based on the distances of the scan-in states from reachable states, and the lengths of the periods. Functional and partially functional broadside tests are generated preferring shorter periods with smaller Hamming distances. The results are compared with those of an LFSR-based approach.

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Achieving high encoding efficiency with partial dynamic LFSR reseeding

Cited by 25 publications

References 12 publications

High-Quality Statistical Test Compression With Narrow ATE Interface

High-Quality Statistical Test Compression With Narrow ATE Interface

Test Encoding for Extreme Response Compaction

Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside Tests

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