Achieving manufacturing business integration through the combined formalisms of CIMOSA and Petri nets

Abstract

This paper introduces an approach to achieving business integration within a manufacturing system based on executing models of system behaviour that describe important aspects of coordination within the system. The strategy for demonstrating the approach is to combine formalisms derived principally from CIMOSA and Petri nets into an engineering workbench where models (of`what' the integrated manufacturing system is expected to achieve and`how' the system can achieve it) are executed. An important aspect of the work is to enable modelling and simulation to be consistently performed using the same set of models that are used to construct the run time system. As part of this overall support, this paper details the results obtained from the realization, application and evaluation of the engineering workbench, particularly in regard to its support for modelling and simulation.

Managing change within IBM's complex supply chain

“…In order to ensure the process was described in a uniform and commonly agreed format a mapping convention would need to be used. There are many different mapping conventions (Berio and Vernadat, 2001;Wilson et al, 1999); however, the two most widely used are the IDEF (Integrated DEFinition for function modelling) (Mayer et al, 1992) and CIMOSA conventions (Computer Integrated Manufacturing Open System Architecture).…”

“…For the purpose of mapping the order flow process either approach would suffice. However, CIMOSA's richer mapping capabilities (Berio and Vernadat, 2001;Wilson et al, 1999) would allow for a deeper understanding of the organization's view of the process in terms of responsibilities and authorities. However, CIMOSA is a complete mapping methodology focusing on information, resource, and organizational views (Cheng-Leong et al, 1999), whereas IDEF is a family of independent, but inter-connectable, mapping techniques which in turn are designed to focus on separate aspects of the mapping process.…”