Adaptive weak-value amplification with adjustable postselection

Li, Fēi; Huang, Jianheng; Zeng, Guihua

doi:10.1103/physreva.96.032112

Cited by 20 publications

(12 citation statements)

References 23 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Indeed, Ref. [40] also shows that in IWVA, the optimal choice of P f (and, hence, the pre-and post-selected states) is sensitive to the parameter g. It follows that one must have some prior knowledge of g in order to design a measurement system using IWVA. Consequently, we choose to implement the optimal RWVA scheme and make a comparison to CM in our experiment.…”

Section: Theoretical Frameworkmentioning

confidence: 99%

Approaching Quantum-Limited Metrology with Imperfect Detectors by Using Weak-Value Amplification

Liu

Datta

et al. 2020

Phys. Rev. Lett.

View full text Add to dashboard Cite

Weak value amplification (WVA) is a metrological protocol that amplifies ultra-small physical effects. However, the amplified outcomes necessarily occur with highly suppressed probabilities, leading to the extensive debate on whether the overall measurement precision is improved in comparison to that of conventional measurement (CM). Here, we experimentally demonstrate the unambiguous advantages of WVA that overcome practical limitations including noise and saturation of photo-detection and maintain a shot-noise-scaling precision for a large range of input light intensity well beyond the dynamic range of the photodetector. The precision achieved by WVA is six times higher than that of CM in our setup. Our results clear the way for the widespread use of WVA in applications involving the measurement of small signals including precision metrology and commercial sensors.

show abstract

Section: Theoretical Frameworkmentioning

confidence: 99%

Approaching Quantum-Limited Metrology with Imperfect Detectors by Using Weak-Value Amplification

Liu

Datta

et al. 2020

Phys. Rev. Lett.

View full text Add to dashboard Cite

show abstract

“…Weak value amplification (WVA) can greatly improve the sensitivity of the system by introducing the postselection process [13,14]. A lot of experiments and theoretical work have verified the feasibility of WVA [15][16][17][18].…”

Section: Introductionmentioning

confidence: 99%

Ultrasensitive refractive index sensor with rotatory biased weak measurement

Zhou¹,

Xu²,

Zhang³

et al. 2022

Preprint

View full text Add to dashboard Cite

In this paper, we present an ultrasensitive reflection-type optical refractive index (RI) sensor with rotatory biased weak measurement. In our scheme, based on the optical rotatory dispersion effect, a bias phase is introduced by the postselection process. The bias phase without dispersion effect makes stronger postselection and smaller coupling strength accessible. Experimentally, our scheme obtains an enhanced sensitivity of 13605 nm/RIU while detecting fewer photons, which can effectively alleviate the saturation effect of the detector. We demonstrate a RI resolution of 1.8×10 −7 RIU. With response model and noise analysis of the CCD detector, we show that the performance of the RI sensor depends mainly on the long-time correlated noise of the light source and detector, and prove that our scheme gains advantages due to its high sensitivity. An ultimate resolution of 10 −9 RIU can be attained for our system.

show abstract

“…However, considering a practical scenario, the measurement scheme should simultaneously satisfy the requirements of high precision, strong robustness, and wide dynamic range which can not be realized by the standard weak measurement (SWM). Great efforts have been made to improve the SWM performance: SWM with powerrecycling [29,30], difference measurement [31,32], or bias measurement [33,34] were introduced to further increase the measurement precision and robustness; inverse WVA [35] and adaptive WVA scheme [36] were developed to solve the problem of narrow high-sensitivity dynamic range that exists in the SWM. Though weak measurement can be carried out in many different systems, optical system is one of the best choices.…”

Section: Introductionmentioning

confidence: 99%

Ten more times precision improved method for surface roughness estimation with weak measurement

Qu¹,

Ye²,

Han³

et al. 2022

Preprint

View full text Add to dashboard Cite

High-precision surface roughness estimation plays an important role in many applications. However, the classical estimating methods are limited by shot noise and only can achieve the precision of 0.1 nm with white light interferometer. Here, we propose two weak measurement schemes to estimate surface roughness through spectrum analysis and intensity analysis. The estimating precision with spectrum analysis is about 10 −5 nm by using a currently available spectrometer with the resolution of ∆λ = 0.04 pm and the corresponding sensitivity is better than 0.1 THz/nm. And the precision and sensitivity of the light intensity analysis scheme achieve as high as 0.07 nm and 1/nm, respectively. By introducing a modulated phase, we show that the sensitivity and precision achieved in our schemes can be effectively retained in a wider dynamic range. We further provide the experimental design of the surface profiler based on our schemes. It simultaneously meets the requirements of high precision, high sensitivity, and wide measurement range, making it to be a promising practical tool.

show abstract

Adaptive weak-value amplification with adjustable postselection

Cited by 20 publications

References 23 publications

Approaching Quantum-Limited Metrology with Imperfect Detectors by Using Weak-Value Amplification

Approaching Quantum-Limited Metrology with Imperfect Detectors by Using Weak-Value Amplification

Ultrasensitive refractive index sensor with rotatory biased weak measurement

Ten more times precision improved method for surface roughness estimation with weak measurement

Contact Info

Product

Resources

About