2004
DOI: 10.1016/j.actamat.2003.12.003
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Adhesion energy between metal films and polymers obtained by studying buckling induced by hydrogen

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Cited by 85 publications
(50 citation statements)
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“…In particular, in buckled thin films there is much less in-plane additional strain energy involved during hydrogen absorption than in films fully clamped on the substrate. 17 The strain reduction induced by buckling and cracking is most probably responsible for the observed shrinkage of the hysteresis loop between cycles 1 and 18. In Fig.…”
Section: Fig 3 ͑Color Online͒ ͑Symbols͒mentioning
confidence: 99%
“…In particular, in buckled thin films there is much less in-plane additional strain energy involved during hydrogen absorption than in films fully clamped on the substrate. 17 The strain reduction induced by buckling and cracking is most probably responsible for the observed shrinkage of the hysteresis loop between cycles 1 and 18. In Fig.…”
Section: Fig 3 ͑Color Online͒ ͑Symbols͒mentioning
confidence: 99%
“…Hence, there is a high probability for positron trapping in open volume defects at interfaces between columns. Since a straight buckle can release the in-plane stress only in a single in-plane direction the film is forced to expand also in the perpendicular direction [2]. As a consequence in the further stage of buckling (0.15 < x H < 0.20) the buckles become curved, see Fig.…”
Section: Resultsmentioning
confidence: 99%
“…plastic deformation) one can expect that new defects are introduced during buckling process. Although the morphology of buckles was investigated in a number of works [2][3][4], there is still a lack of information about defect evolution in buckled films. In the present work slow positron implantation spectroscopy (SPIS) was employed for characterization of development of defects in thin Pd films loaded with hydrogen.…”
mentioning
confidence: 99%
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“…Neither buckling, nor detachment of the film from the substrate, was observed after hydrogen loading, indicating good adhesion between the Ti-films and the sapphire substrates. The stresses developing in the film during hydrogen loading were in situ determined by measuring the deflection of the substrate using the setup described elsewhere [13], calculating its radius of curvature and inserting it to Stoney's equation [14]:…”
Section: Methodsmentioning
confidence: 99%