2007
DOI: 10.1016/j.tsf.2006.12.006
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Adsorption of thin isobutane films on silicon investigated by X-ray reflectivity measurements

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Cited by 3 publications
(1 citation statement)
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“…A calculation of the effective Hamaker constant using a Lifshitzbased approach leads to a value of A th eff = À2.3 Â 10 À19 J. This deviation between the experimental and theoretical value is consistent with other measurements where a shift of the experimental Hamaker constant to lower values was found (Paulus et al, 2005(Paulus et al, , 2008Shokuie et al, 2007).…”
Section: Figuresupporting
confidence: 86%
“…A calculation of the effective Hamaker constant using a Lifshitzbased approach leads to a value of A th eff = À2.3 Â 10 À19 J. This deviation between the experimental and theoretical value is consistent with other measurements where a shift of the experimental Hamaker constant to lower values was found (Paulus et al, 2005(Paulus et al, , 2008Shokuie et al, 2007).…”
Section: Figuresupporting
confidence: 86%