Retaining rings made of poly͑phenylene sulfide͒ ͑PPS͒ and polyetheretherketone ͑PEEK͒ with two different slot designs were subjected to a 4 h wear test. During the chemical mechanical planarization ͑CMP͒ process, the PPS retaining ring induced a higher coefficient of friction ͑COF͒ by ϳ0.1 than the PEEK retaining rings. In addition, the PPS retaining ring exhibited a higher wear rate than the PEEK retaining rings by ϳ28%. Although the retaining ring slot design did not significantly affect the COF and wear rate, retaining rings with sharp slot edges resulted in higher pad surface abruptness.During chemical mechanical planarization ͑CMP͒ processes, retaining rings are used to secure wafers from slipping out of the wafer carrier head. For a typical polishing platform, such as Applied Materials Mirra and Reflexion polishers, the retaining ring is pressed against the pad surface at a pressure normally higher than the wafer polishing pressure. As a result, frictional force is generated among the retaining ring, slurry, and pad surface, leading to an increase in the pad temperature, which in turn impacts material removal rate and nonuniformity. In recent years, advanced engineering plastics have become materials of choice for constructing retaining rings because they can be easily modified to withstand various chemicals in CMP slurries while maintaining dimensional stability over a wide range of temperatures and pressures and extending the service life of retaining rings. Furthermore, compared with metal and ceramics, advanced engineering plastics can be formulated to have a very low level of ionic impurities and inorganic element contamination.There are several patents and publications associated with retaining rings and their applications. For example, Chen and Zuniga and Chen et al. showed new retaining ring slot designs in 2005. 1,2 Zuniga et al. invented a multilayer retaining ring and Wang and Zuniga improved the design afterward. 3,4 Chen et al. invented a specific retaining ring consisting of two different parts. 5 Hoffman compared the thermal, chemical, and mechanical properties of several commercially advanced machinable plastics. 6 In that study, the wear results were simulated without any experimental confirmation. Moussa and Quartapella and Gitis et al. performed wear tests on three materials commonly used for CMP retaining rings ͓poly͑phe-nylene sulfide͒ ͑PPS͒, polyetheretherketone ͑PEEK͒, and polycarbonate͔ and reported coefficient of friction ͑COF͒ and wear rates. 7,8 However, the wear tests were conducted using a small piece of substrate that was substantially different in size and design compared to the actual retaining rings used in the semiconductor industry.In this study, three retaining rings designed for 200 mm wafer polishing were subjected to a 4 h wear test. The retaining rings were made of two different materials ͑PPS and PEEK͒ with two different slot designs. Frictional force generated among the retaining ring, slurry, and pad surface was measured in real-time during the wear test. Pad surfa...