2009
DOI: 10.1016/j.wear.2008.04.079
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Advances in thick and thin film analysis using interferometry

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Cited by 20 publications
(14 citation statements)
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“…White light interferometry was used to accurately measure surface topography and step height. [12][13][14] In …”
mentioning
confidence: 99%
“…White light interferometry was used to accurately measure surface topography and step height. [12][13][14] In …”
mentioning
confidence: 99%
“…9 Similar information is can obtain and by the study superficial layers by diffraction with electrons. [12][13][14][15] By this method is can research a thickness of 10 -…”
Section: Researching Methods For the Thin Superficial Layersmentioning
confidence: 99%
“…Research into the degradation of bulk polymers has a longer history and is more comprehensive, and many quality reviews have already been written in this area. 23,84,86,87,[89][90][91] This paper focuses on films and effort has been taken to concentrate on pertinent degradation mechanisms found specifically in these systems rather than discussing all possible mechanisms in a generic fashion. It will be noted that liquid interactions are not included.…”
Section: Content Of Papermentioning
confidence: 99%