1996
DOI: 10.1016/0169-4332(95)00234-0
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AES and SRUPS studies on surface passivation of GaAs by (NH4)2Sx sulfurization techniques

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Cited by 4 publications
(3 citation statements)
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“…b). The Ga 2p 3/2 signal consists of two peaks (fitted as single Voigt profiles), which can be assigned to surface (I) and bulk (II) related contributions . After annealing, the overall intensity of the Ga 2p 3/2 emission is increased with an enhanced surface related component (II).…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…b). The Ga 2p 3/2 signal consists of two peaks (fitted as single Voigt profiles), which can be assigned to surface (I) and bulk (II) related contributions . After annealing, the overall intensity of the Ga 2p 3/2 emission is increased with an enhanced surface related component (II).…”
Section: Resultsmentioning
confidence: 99%
“…From the position of the Ga 2p 3/2 (I) peak in Fig. 1b, which is increased after annealing we conclude that a gallium sulfide (GaS) phase was formed upon heating [20]. Also the occurrence of the S 2p component (I) in the same figure supports this finding since it is assigned to a S-Ga bond [21].…”
Section: Cu 2pmentioning
confidence: 97%
“…Photoemission spectroscopy of (ΝΗ4)2Sx treated surfaces revealed the existence of the As-S, Ga-S and S-S bonds [1]. Nowadays, there is a common opinion that the passivation removes the native oxide leaving the surface with a layer of sulfur bonded to Ga and As.…”
Section: Resultsmentioning
confidence: 99%