1991
DOI: 10.1049/el:19911268
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Amorphous carbon/crystalline silicon high voltage heterojunction diode prepared by photochemical vapour deposition

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“…If the explanation given in [7] is true then we can say that the trapped charge densities in our devices, both at the interface and in the bulk, are negligibly small and have no significant influence on device behaviour. Production of a-C:H/Si diodes (for high voltage operation) using the technique of photochemical vapour deposition has also been reported [8]. This technique does not expose the growing film to ion bombardment and, it is suggested, results in reduced trapped charge densities.…”
Section: -Dc Self-bias (-Volts)mentioning
confidence: 99%
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“…If the explanation given in [7] is true then we can say that the trapped charge densities in our devices, both at the interface and in the bulk, are negligibly small and have no significant influence on device behaviour. Production of a-C:H/Si diodes (for high voltage operation) using the technique of photochemical vapour deposition has also been reported [8]. This technique does not expose the growing film to ion bombardment and, it is suggested, results in reduced trapped charge densities.…”
Section: -Dc Self-bias (-Volts)mentioning
confidence: 99%
“…This technique does not expose the growing film to ion bombardment and, it is suggested, results in reduced trapped charge densities. The authors of [8] have successfully demonstrated that high voltage diodes prepared by this technique can withstand reverse bias voltages upto 400 V. Through optimisation of the growth conditions using detailed investigation of the film properties a more robust diode has been realised by rf-PECVD. In their report [7], a number of large crystallites of diamond, of size between 100 nm and 200 nm, were observed in the amorphous carbon matrix.…”
Section: -Dc Self-bias (-Volts)mentioning
confidence: 99%