2005
DOI: 10.1063/1.2149149
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An atomic force microscope tip as a light source

Abstract: We present a simple method for causing the end of a silicon nitride atomic force microscope (AFM) tip to emit light, and we use this emitted light to perform scanning near-field optical microscopy. Illumination of a silicon nitride AFM tip by blue (488nm) or green (532nm) laser light causes the sharp part of the tip to emit orange light. Orange light is emitted when the tip is immersed in either air or water; and while under illumination, emission continues for a period of many hours without photobleaching. By… Show more

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Cited by 6 publications
(12 citation statements)
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“…There have been a number of reports on conventional slow AFM combined with confocal fluorescence [228][229][230][231], conventional Raman scattering [232,233], coherent anti-Stokes Raman scattering [234,235], or TIRF [236][237][238] microscopes. When the simultaneous recording of optical and AFM images is required, some precautions are necessary regarding the luminescence of the cantilever tip [239][240][241] and the photothermal bending of the cantilever [111]. In tapping-mode AFM, the DC deflection of a cantilever does not affect AFM imaging; thus, the photothermal bending of the cantilever should not be a problem provided its bending is not too large and the light power is stable.…”
Section: High-speed Afm Combined With Optical Microscopementioning
confidence: 99%
“…There have been a number of reports on conventional slow AFM combined with confocal fluorescence [228][229][230][231], conventional Raman scattering [232,233], coherent anti-Stokes Raman scattering [234,235], or TIRF [236][237][238] microscopes. When the simultaneous recording of optical and AFM images is required, some precautions are necessary regarding the luminescence of the cantilever tip [239][240][241] and the photothermal bending of the cantilever [111]. In tapping-mode AFM, the DC deflection of a cantilever does not affect AFM imaging; thus, the photothermal bending of the cantilever should not be a problem provided its bending is not too large and the light power is stable.…”
Section: High-speed Afm Combined With Optical Microscopementioning
confidence: 99%
“…To characterize the produced nanostructures, a home-constructed multifunctional microscope combining atomic force microscope (AFM), near-field scanning optical microscope (NSOM), and far-field optical microscope was used. ,, The detailed setup and operation has been reported previously. The near-field scanning optical microscopy used for this work follows an apertureless configuration. , Figure A shows the schematic of the optical path.…”
Section: Resultsmentioning
confidence: 99%
“…However, conventional aperture NSOM has great difficulty detecting the Moiré effect due to low photon throughput, difficulties in operation, and insufficient spatial resolution. This work utilizes a home-built apertureless NSOM for the investigation of the Moiré effect. , In this design, NSOM light source was produced by excitation of commercial silicon nitride (Si 3 N 4 ) AFM probes with an ultraviolet laser ( e.g. , 405 nm).…”
mentioning
confidence: 99%
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“…When simultaneous recording is required, various precautions are necessary. Cantilever tips of amorphous silicon and amorphous silicon nitride are known to be strongly photoluminescent [44][45][46], while crystalline silicon tips are much less luminescent [33]. EBD carbon tips are also less luminescent.…”
Section: Visibilitymentioning
confidence: 99%