An indirect measurement method for S-parameters which is based on reduction to eigenvalue problem

Maeda, Noboru; Fukui, Shinji; Sekine, Toshikazu; Takahashi, Yasuhiro

doi:10.1109/epeps.2017.8329755

Cited by 7 publications

(1 citation statement)

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“…If the three loads are selected such as, their reflections coefficients are related to a non-zero constant k1 defined by (8), (6) and 7can be combined to extract the submatrix Saa according to (9)…”

Section: B Estimation Of Saamentioning

confidence: 99%

Fast and efficient approach to predict EMC immunity of complex equipment after a component change

Chetouani¹,

Serpaud²,

Boyer

et al. 2020

2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE

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This paper describes a fast methodology for managing the obsolescence issues of components in industrial equipment (aeronautical and/or automotive). The objective is to predict Electromagnetic Compatibility (EMC) non-compliance risk or guarantee a non-regression of EMC performances, in conducted immunity, after a component change. This could be achieved through an equivalent test at the component level if the residual voltage at its pins could be estimated. Accordingly, this approach aims to decline conducted immunity requirements, from the connector at the input of an equipment to an obsolete component placed on one of its boards. Which must constitute a faster and cheaper solution than systematic EMC qualification test of the equipment each time a component is replaced.

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Section: B Estimation Of Saamentioning

confidence: 99%