An innovative two-stage data compression scheme using adaptive block merging technique

Abstract

Test data has increased enormously owing to the rising on-chip complexity of integrated circuits. It further increases the test data transportation time and tester memory. The non-correlated test bits increase the issue of the test power. This paper presents a two-stage block merging based test data minimization scheme which reduces the test bits, test time and test power. A test data is partitioned into blocks of fixed sizes which are compressed using two-stage encoding technique. In stage one, successive blocks are merged to retain a representative block. In stage two, the retained pattern block is further encoding based on the existence of ten different subcases between the sub-block formed by splitting the retained pattern block into two halves. Noncompatible blocks are also split into two sub-blocks and tried for encoded using lesser bits. Decompression architecture to retrieve the original test data is presented. Simulation results obtained corresponding to different ISCAS'89 benchmarks circuits reflect its effectiveness in achieving better compression.

On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization

“…A huge TAV is stored in the tester's memory as well as then transfer among tester's unit as well as circuit under test (CUT) during SoC testing. Test data compression schemes [21] act as a hopeful solution for solving the issue of TDV reduction to SoCs. Furthermore, it lessens the TAT, peak as well as average power.…”

“…So, several test compaction methods [14] possess the capability to control the test data volume in a great extent. Then, the compressed experimental sets might attain less detection of non-modeled physical faults [9,21]. The BIST is widely used for memory testing and is not logical BIST requires more test time [7].…”

“…The test results established the showed test scheme decompression in conventional circuits assumed limitless blame scope, lesser test period also the minor equipment's overhead was vary the forms collected, the assistance of recent days' mechanical instruments. Vohra et al [21] have presented an efficient test data compression scheme that maximizes test data transport time and tester memory. A test data is dividing into blocks of standard sizes that are compressed utilizing2-stage encoding method.…”