An SEU analysis approach for error propagation in digital VLSI CMOS ASICs

Abstract

A probabilistic description of error propagation in complex circuits is formulated and solved as a set of linear equations. Comparisons are made with experimental data.

Proton-induced transients in optocouplers: in-flight anomalies, ground irradiation test, mitigation and implications

“…Satellite system designers and parts engineers, however, are not always aware of single event transient issues. Over the past few years, several publications have noted the effects of SETs in linear devices [3][4][5], combinational logic [6][7][8], and optical subsystems [9][10][11][12][13][14][15][16][17][18][19][20]. The optocoupler, being a combination of an optical system and a linear device, has not previously been investigated in this regard.…”

A comprehensive analog single-event transient analysis methodology

“…This voltage deviation or pulse is known as a single-event transient (SET) [1]- [42]. Over the years, there have been several attempts to categorize the SET response of analog devices [43]- [59].…”

Modeling single-event effects in a complex digital device

“…This probability is denoted as . The approach used to model this probability is a simplified version of the approach described in [12]. Logic is divided into two types: control logic and datapath logic.…”