2003
DOI: 10.1109/ted.2003.815604
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Analysis and simulation of a mid-infrared p/sup +/-InAs/sub 0_55/Sb/sub o_15/P/sub 0_30//n/sup 0/-InAs/sub 0_89/Sb/sub 0_11//N/sup +/-InAs/sub 0_55/Sb/sub 0_15/P/sub 0_3-/ double heterojunction photodetector grown by LPE

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Cited by 33 publications
(10 citation statements)
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“…where CM represents the hot carrier multiplication factor [69][70][71][72][73][74] which is a function of bias voltage and ambient temperature, c is the speed of light, J l is the photocurrent density, and l represents the wavelength of the incident radiation. The net QE ext of the photodetector comprises of neutral p + -(QE ext ) p + , neutral n-(QE ext ) n , and the depletion (QE ext ) dep regions, and can be written as: 24,[90][91][92] QE ext ¼ CM(V,T) Â ((QE ext ) p + + (QE ext ) n + (QE ext ) dep ) (22) where…”
Section: Optical Characterizationmentioning
confidence: 99%
“…where CM represents the hot carrier multiplication factor [69][70][71][72][73][74] which is a function of bias voltage and ambient temperature, c is the speed of light, J l is the photocurrent density, and l represents the wavelength of the incident radiation. The net QE ext of the photodetector comprises of neutral p + -(QE ext ) p + , neutral n-(QE ext ) n , and the depletion (QE ext ) dep regions, and can be written as: 24,[90][91][92] QE ext ¼ CM(V,T) Â ((QE ext ) p + + (QE ext ) n + (QE ext ) dep ) (22) where…”
Section: Optical Characterizationmentioning
confidence: 99%
“…To derive the dark current, we use a similar approach as in Ref. 16. The steady-state continuity equations governing the distribution of minority carriers in the GaAsSb are given by…”
Section: The Current Arising From Generation Recombination (Gr)mentioning
confidence: 99%
“…These components arise from the contribution of the three regions, e.g., neutral n-region where a(k) is the optical absorption coefficient of the material which is a function of wavelength k, R is the Fresnel reflection coefficient at the entrance, P opt is the incident optical power, m is the frequency of radiation and A is the device area. The quantum efficiency components can be obtained as [25,26] where L p and L n are the hole and electron diffusion lengths in n-and p-regions, respectively. c n = S n L n /D n and c p = S p L p /D p are the ratio of surface to bulk recombination velocity in n-and p-regions, respectively.…”
Section: Rðvþmentioning
confidence: 99%