2022
DOI: 10.1016/j.snb.2022.131673
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Analysis of Cr/Au contact reliability in embedded poly-Si micro-heater for FET-type gas sensor

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Cited by 9 publications
(2 citation statements)
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“…Heating small areas with microheaters is an important task for several applications, from flow-sensing [ 37 , 38 ], degassing, driving and assisting electrochemical sensors [ 39 , 40 , 41 , 42 , 43 , 44 ], to microfluidic system temperature control and sensing [ 45 , 46 , 47 ]. Carbon and graphene-based printed devices have recently demonstrated unprecedented performance in temperature sensing and microheater fabrication [ 16 , 48 , 49 , 50 , 51 ]; due to their unique properties, such as high mechanical durability, resistance to environmental corrosion and contamination, and an ability to reach high temperatures without changing their properties, these materials are excellent candidates for these applications.…”
Section: Introductionmentioning
confidence: 99%
“…Heating small areas with microheaters is an important task for several applications, from flow-sensing [ 37 , 38 ], degassing, driving and assisting electrochemical sensors [ 39 , 40 , 41 , 42 , 43 , 44 ], to microfluidic system temperature control and sensing [ 45 , 46 , 47 ]. Carbon and graphene-based printed devices have recently demonstrated unprecedented performance in temperature sensing and microheater fabrication [ 16 , 48 , 49 , 50 , 51 ]; due to their unique properties, such as high mechanical durability, resistance to environmental corrosion and contamination, and an ability to reach high temperatures without changing their properties, these materials are excellent candidates for these applications.…”
Section: Introductionmentioning
confidence: 99%
“…However, the reliability of the sensor is influenced not only by the sensing material (MOX), but also by the transducer of the sensor [12][13][14]. In particular, when configuring a sensitive amplifier circuit with n-and p-channel FETtype (nFET and pFET) gas sensors, the nFET-type gas sensor is exposed to iterative off-state stress (OSS) during the circuit operation [15][16][17].…”
Section: Introductionmentioning
confidence: 99%