2011
DOI: 10.1007/s10825-011-0359-6
|View full text |Cite
|
Sign up to set email alerts
|

Analysis of double-gate CMOS for double-pole four-throw RF switch design at 45-nm technology

Abstract: In this paper, we have analyzed a 45-nm RF CMOS switch design technology with the double-pole fourthrow circuit by using independently controlled double-gate MOSFET. The proposed switch reduces the number of transistors and increases the logic density per unit area as compare to the conventional CMOS switch. With the unique independent double-gate properties, we have demonstrated the potential advantages in terms of the drain current, threshold voltage, attenuation with ON resistance, flat-band capacitances, c… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2011
2011
2013
2013

Publication Types

Select...
5
2

Relationship

3
4

Authors

Journals

citations
Cited by 25 publications
(2 citation statements)
references
References 39 publications
0
2
0
Order By: Relevance
“…With the multiple antennas, data transfer rate is increased by the same factor as the numbers of antenna are used. Antenna selection system and switching mechanism is essential to circumvent the uses of several RF chain associated with the various antennas [8,9].…”
Section: Antenna Systemmentioning
confidence: 99%
“…With the multiple antennas, data transfer rate is increased by the same factor as the numbers of antenna are used. Antenna selection system and switching mechanism is essential to circumvent the uses of several RF chain associated with the various antennas [8,9].…”
Section: Antenna Systemmentioning
confidence: 99%
“…Few attempts have been made to build a scalable RF-MOSFET model, including the layout-based extrinsic elements. For RF MOSFET modeling, lots of issues need to be considered [14][15][16] especially the three most important parasitic components: gate resistance R g , which influences the input impedance and noise performance of RF-MOSFETs [17,18].…”
Section: Earlier Workmentioning
confidence: 99%