Abstract-This paper investigates the phase noise in LC oscillators with NMOS cross-coupled pair by means of a linear analysis. The latter includes the impact of noise sources that are often neglected, such as gate leakage shot noise, induced gate noise and all terminal access resistances noise. Despite not considering up-conversion of flicker noise, this linear analysis still provides reliable and useful results, demonstrated by means of a detailed comparison between the analytical description and simulations results from a 40 nm and a 28 nm CMOS technology.Index Terms-LC oscillators, phase noise, linear analysis, inversion coefficient
I. INTRODUCTIONThe typical architecture of transceivers used in radios relies on frequency synthesizers for generating accurate and low-noise carriers, which are used to up-and down-convert the base-band signal carrying data. Voltage-Controlled-Oscillators (VCO) are one of the key building blocks of frequency synthesizers and they are usually classified in two families: harmonic (i.e. LCbased) and relaxation oscillators (i.e. ring-based). The former category includes the oscillators which are more suited for the aforementioned purpose, since they embed an LC tank to select the target frequency. As a consequence, the output is an almost perfect sinusoid and its phase noise performance is pretty good, compared to the more noisy square wave produced by a ring-oscillator. However, the better output signal quality comes at the price of a larger power consumption.As a matter of fact, due to technology scaling, the impact of parasitic resistances has increased. Indeed, even if the metallic gate has become a process option for most recent technology nodes (e.g. 28 nm technology), the gate resistance measured on these devices is still relevant and even greater than in older nodes [1] [2]. Moreover, the gate leakage shot noise contribution has increased mainly due to the shrinking of the gate oxide thickness, although the inclusion of high-k dielectric materials in latest nodes should attenuate this effect.An analytical derivation of phase noise is carried out including all noise sources, highlighting the transfer function of each of them to the output. The complete expressions come also in a simplified form, in order to provide an insight into possible strategies for noise optimization.The paper is organized as follows. In Section II the description of the circuit and of the transistor model with the noise sources is carried out. Section III details the analysis showing a comparison between analytical and simulated results, followed by conclusions.