2005 European Conference on Power Electronics and Applications 2005
DOI: 10.1109/epe.2005.219304
|View full text |Cite
|
Sign up to set email alerts
|

Analysis of premature breakdown in high-power devices using IBIC microscopy

M. Zmeck
1
,
L.J. Balk
2
,
A. Pugatschow
3
et al.
Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2007
2007
2017
2017

Publication Types

Select...
3
1

Relationship

1
3

Authors

Journals

citations
Cited by 4 publications
references
References 5 publications
0
0
0
Order By: Relevance

Time resolved determination of electrical field distributions within dynamically biased power devices by spectral EBIC investigations

Pugatschow1,
Heiderhoff2,
Balk3
2007
Microelectronics Reliability
Self Cite
3
0
1
0
View full textAdd to dashboardCite

Time resolved determination of electrical field distributions within dynamically biased power devices by spectral EBIC investigations

Pugatschow1,
Heiderhoff2,
Balk3
2007
Microelectronics Reliability
Self Cite
3
0
1
0
View full textAdd to dashboardCite

Analysis of power devices breakdown behaviour by ion beam and electron beam induced charge microscopy

Siemieniec1,
Pugatschow2,
Geissler3
et al. 2008
9th International Seminar on Power Semiconductors (ISPS 2008)
4
0
2
0
View full textAdd to dashboardCite

In-Operando Spatial Imaging of Edge Termination Electric Fields in GaN Vertical p-n Junction Diodes

Léonard
1
,
Dickerson
2
,
King
3
et al. 2016
IEEE Electron Device Lett.
2
0
1
0
View full textAdd to dashboardCite
scite logo

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Product
Browser ExtensionAssistant by sciteCitation Statement SearchReference CheckVisualizationsDashboardsExplore JournalsExplore OrganizationsExplore FundersEmbedding BadgeEmbedding Citation SearchPricing
Resources
BlogHelp & FAQAccessibility StatementAPI TermsFor Universities & GovernmentsFor ResearchersFor PublishersFor Corporate, Pharma & EnterpriseAuthor MarketingBecome an AffiliateGet an organization trial or quotescite Data & Services
About
News & PressCareersRead our PaperCoverage

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

BlogTerms and ConditionsAPI TermsPrivacy PolicyContactCookie PreferencesDo Not Sell or Share My Personal Information

Copyright © 2024 scite LLC. All rights reserved.

Made with 💙 for researchers

Part of the Research Solutions Family.