1987
DOI: 10.1063/1.339007
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Analytical modeling of a-Si:H thin-film transistors

Abstract: A new analytic model for amorphous silicon thinfilm transistors Accurate analytical expressions have been derived, from basic principles, for the sheet conductance of the n-channel a-Si:H thin-film transistors. The basic principles apply two different energy band models, one for the a-Si bulk and one for the a-Si-Si0 2 interface. The physical parameters needed for the model are easily obtained from an experimental sheet conductance versus the gate voltage curve. The basic expressions for the sheet conductance … Show more

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Cited by 16 publications
(3 citation statements)
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“…Theoretical studies of ambipolar transport in FETs were performed for hydrogenated amorphous silicon (a-Si:H) [37,38] where ambipolar transport was observed for the first time [39]. Those models were useful for describing measured characteristics but not for the extraction of microscopic transport parameters.…”
Section: Analytical Modelmentioning
confidence: 99%
“…Theoretical studies of ambipolar transport in FETs were performed for hydrogenated amorphous silicon (a-Si:H) [37,38] where ambipolar transport was observed for the first time [39]. Those models were useful for describing measured characteristics but not for the extraction of microscopic transport parameters.…”
Section: Analytical Modelmentioning
confidence: 99%
“…[26][27][28][29][30] It is based on the distribution of transport and localized states in amorphous silicon. [26][27][28][29][30] It is based on the distribution of transport and localized states in amorphous silicon.…”
Section: Amorphous-silicon Modelmentioning
confidence: 99%
“…An analytical model for the corresponding modification of the Shockley model has been derived in Refs. It is well known that such phenomenon occurs in thin-film transistors (TFT) with amorphous-silicon (a-Si) as the active layer (often simply denoted either as TFT model or as a-Si model), [26][27][28][29][30] which are used in active-matrix displays. 16 Models that include the field dependence of the mobility have been discussed in Refs.…”
Section: Introductionmentioning
confidence: 99%