2004
DOI: 10.1016/j.spmi.2004.09.016
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Anisotropy of the dielectric function for wurtzite InN

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Cited by 63 publications
(48 citation statements)
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“…4b and Fig. 5) are summarized in Table X and are in good agreement with previous studies [9] and we see that the static dielectric constant of TlN is bigger than the other III-group nitrides [47][48][49]. The static refraction index (Eq.…”
Section: Table IXsupporting
confidence: 90%
See 1 more Smart Citation
“…4b and Fig. 5) are summarized in Table X and are in good agreement with previous studies [9] and we see that the static dielectric constant of TlN is bigger than the other III-group nitrides [47][48][49]. The static refraction index (Eq.…”
Section: Table IXsupporting
confidence: 90%
“…(27) and Fig. 6) of TlN in GGA (PBE) and LDA approximations are given in Table XI and we see that the refraction index of TlN is bigger than the other III-group nitrides [47][48][49]. …”
Section: Table IXmentioning
confidence: 83%
“…This model corroborates the results found by other authors for undoped or n-type conductive InN on different substrates. 17,29,41 To label the critical points, the nomenclature of Goldhahn et al 41 is used here. A M0-CP lineshape is utilized for the band gap (E 0 ) region.…”
Section: Resultsmentioning
confidence: 99%
“…For determination of this component, measurements on samples of semi-polar or non-polar orientation would be necessary. 29 Thus, the InN layer was assumed to be isotropic and an effective DF for InN is obtained for the NIR-VUV spectral range. The isotropic MDF of InN was obtained by using a set of the KramersKronig consistent Herzinger-Johs parameterized semiconductor oscillator models for critical point (CP) structures in crystalline semiconductor DF's (Psemi-CP model).…”
Section: A Nir-vuv Model Dielectric Functionmentioning
confidence: 99%
“…Even basic parameters, such as its direct bandgap value, were the subject of some controversy [3][4][5][6][7][8], it is now clear that InN a direct gap of of ~0.7eV, in contrast to the previously believed 1.9eV. In many instances the larger reported bandgap values can be understood by a significant Burstein-Moss shift due to the high free electron concentration in the samples [9].…”
Section: Introductionmentioning
confidence: 99%