2015
DOI: 10.1016/j.solener.2015.05.019
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Annealing treatment of Cu(In,Ga)Se2 absorbers prepared by sputtering a quaternary target for 13.5% conversion efficiency device

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Cited by 25 publications
(8 citation statements)
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“…After ultrasound-H 2 O 2 and ultrasound-O 3 treatments, the CIGS diffraction peaks of the P-type absorption layer were retained, which are derived from the CuIn x Ga 1– x Se 2 phase. According to the JCPDS card data of CuGa 0.6 In 0.4 Se 2 (#35-1101) and CuGa 0.3 In 0.7 Se 2 (#35-1102), the XRD pattern indicated the occurrence of diffraction peaks of (112), (220/204), and (312/116), which is well matched with the CIGS phase. , The composition of the decapsulated CIGS layer is consistent with the newly synthesized CIGS layer reported in other studies. , It can be inferred that ROS and ultrasound treatment will not change the CIGS crystal structure of the absorbed layer. The strong (110) peak of Mo is observed in the spectrum, which is related to the Mo electrical back contact .…”
Section: Resultsmentioning
confidence: 94%
See 1 more Smart Citation
“…After ultrasound-H 2 O 2 and ultrasound-O 3 treatments, the CIGS diffraction peaks of the P-type absorption layer were retained, which are derived from the CuIn x Ga 1– x Se 2 phase. According to the JCPDS card data of CuGa 0.6 In 0.4 Se 2 (#35-1101) and CuGa 0.3 In 0.7 Se 2 (#35-1102), the XRD pattern indicated the occurrence of diffraction peaks of (112), (220/204), and (312/116), which is well matched with the CIGS phase. , The composition of the decapsulated CIGS layer is consistent with the newly synthesized CIGS layer reported in other studies. , It can be inferred that ROS and ultrasound treatment will not change the CIGS crystal structure of the absorbed layer. The strong (110) peak of Mo is observed in the spectrum, which is related to the Mo electrical back contact .…”
Section: Resultsmentioning
confidence: 94%
“…The XRD spectrum is shown in Figure S8 The composition of the decapsulated CIGS layer is consistent with the newly synthesized CIGS layer reported in other studies. 39,40 It can be inferred that ROS and ultrasound treatment will not change the CIGS crystal structure of the absorbed layer. The strong (110) peak of Mo is observed in the spectrum, which is related to the Mo electrical back contact.…”
Section: Analysis Of Decapsulating Productsmentioning
confidence: 99%
“…Ayachi et al [24] observed additional (400) and (332) peaks after annealing the samples at 540 • C. Similar additional peaks were observed by Liang et al [30] and [32] for substrate temperatures during the deposition ranging from 500 to 550 • C. Results presented in this paper reveal observation of above mentioned peaks for lower substrate temperature (400 • C) under 1.53 Pa of pressure (Table 3). From the studies of Ouyang et al [33], the dependency of the average grain size on annealing temperature can be found. Moreover, the grain size depends not only on the temperature but also on other parameters, such as GGI ratio, sputtering pressure, and power [34].…”
Section: Discussionmentioning
confidence: 99%
“…Furthermore, post-selenization (sulfurization) using H 2 Se (H 2 S) is another issue due to its high toxicity. To relieve these issues, a one-step sputtering process directly from a quaternary CIGSe target without post-selenization has been proposed to be an effective approach due to its simplicity for large-scale mass production, easy composition control, and excellent film uniformity. One of the major challenges for the one-step sputtering process is the Se content in CIGSe films, because the process is carried out without excess Se supply. The efficiency of one-step-sputtered Se-poor CIGSe films can be improved by introducing extra Na, which reduces the amounts of V Se by forming O Se as well as In Cu by forming Na Cu ; after introducing another alkali metal K, the efficiency of 14.1% without post-selenization has been demonstrated .…”
Section: Introductionmentioning
confidence: 99%