1979
DOI: 10.1063/1.91184
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Antireflection properties of indium tin oxide (ITO) on silicon for photovoltaic applications

Abstract: The short-circuit current density (Jsc) of indium tin oxide (ITO/silicon solar cells has been shown both theoretically and experimentally to be a function of the thickness of the ion beam sputtered ITO layer. These results can be accounted for by computing the optical reflection from the ITO/silicon interface.

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Cited by 23 publications
(5 citation statements)
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“…2 b and Supplementary Fig. 13b) [ 35 , 36 ]. Considering the fact that the fabrication of pyramid Si will introduce additional surface charge recombination [ 37 ], planer Si is adopted to form the n-Si MIS junction in this study.…”
Section: Resultsmentioning
confidence: 99%
“…2 b and Supplementary Fig. 13b) [ 35 , 36 ]. Considering the fact that the fabrication of pyramid Si will introduce additional surface charge recombination [ 37 ], planer Si is adopted to form the n-Si MIS junction in this study.…”
Section: Resultsmentioning
confidence: 99%
“…Because the optical properties of the oxide films are relative independent of film thickness, the electrical sheet resistance can be minimized by depositing a thick film. Although thick oxide films can solve some problems, the thicker film may need an additional anti-reflection coating to achieve lower reflection losses [26]. The MIS grating cell appears to be best considering these parameters.…”
Section: Caleulation Of the Effieie!iii!!fmentioning
confidence: 99%
“…These properties make them suitable for application in solar absorbers (Fan et al 1974), for they minimize emittance. The optical refractive indices of these coatings are such that they act as antireflection coatings for Si, GaAs and Ge (Chambouleyron and Saucedo 1979;Cheek et al 1979). Low resistive films of these transparent conductors are therefore suitable for use as top conducting layers in solar cells such as SnO2/Si, rro/Si etc.…”
Section: Introductionmentioning
confidence: 99%