2008
DOI: 10.1016/j.apsusc.2008.05.278
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Application of positron beams to the study of positronium-forming solids

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Cited by 25 publications
(23 citation statements)
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“…Next, hybrid film-5, composite film-5, and the MSQ film were subjected to positron annihilation spectroscopy to investigate the formation of intramolecular void spaces and their size. Positron annihilation spectroscopy is quite useful for analyzing nanometer-sized pores; details regarding positron annihilation spectroscopy and its application for amorphous polymers are described elsewhere. In the present experiments, the lifetime spectra of the samples were decomposed into three components. The longest lifetime (τ 3 ) corresponds to the pick-off annihilation of ortho -positronium ( o -Ps).…”
Section: Results and Discussionmentioning
confidence: 99%
“…Next, hybrid film-5, composite film-5, and the MSQ film were subjected to positron annihilation spectroscopy to investigate the formation of intramolecular void spaces and their size. Positron annihilation spectroscopy is quite useful for analyzing nanometer-sized pores; details regarding positron annihilation spectroscopy and its application for amorphous polymers are described elsewhere. In the present experiments, the lifetime spectra of the samples were decomposed into three components. The longest lifetime (τ 3 ) corresponds to the pick-off annihilation of ortho -positronium ( o -Ps).…”
Section: Results and Discussionmentioning
confidence: 99%
“…In particular, (i) S(E) increases and W(E) decreases at lower fluences (6.25 × 10 14 -3.13 × 10 15 ions/cm 2 ), while (ii) S(E) decreases and W(E) increases at higher fluences (2.5 × 10 16 -5.0 × 10 16 ions/cm 2 ) in the range up to 400 nm in a good agreement with the maximum penetration depth R max B = 400 nm after SRIM simulation; positron energy of 2-3 keV, showing the extreme values of S(E) and W(E), corresponds to a mean depth of 100-200 nm in consistent with the maximum damage R p V,B = 220 nm after SRIM simulation (Figure 2, top). A mean penetration depth of positrons (z m ) was estimated as z m = (40/ρ)E n , where z m is presented in nm, E the positron energy in keV, ρ is the density (1.18 g/cm 3 for PMMA), and n = 1.6 [50]. The results of variable-energy DBAL and PAL measurements at incident positron energy of 2.15 keV were found to be in consistence (Figure 2, bottom) [36].…”
Section: Positron Annihilation Spectroscopy Datamentioning
confidence: 99%
“…Because of poor sensitivity of most conventional techniques, positron annihilation gamma-ray energy spectroscopy (PAGES) and positron annihilation lifetime spectroscopy (PALS) based on variable-energy slow positron beams emerged as very useful techniques for thin films. These techniques have been successfully applied to the studies of various polymeric and porous silica films [1,2].…”
Section: Introductionmentioning
confidence: 99%