Application of surface science techniques to study a gilded Egyptian funerary mask: A multi‐analytical approach

Abstract

A wide range of analytical techniques has been used to study an Egyptian funerary mask of the Ptolemaic period . Secondary electron (SE) and backscattering (BS) images, recorded by a scanning electron microscope (SEM), provided a detailed representation of the metallurgical techniques used to construct the gilded mask. It is confirmed, that the golden leaf used to cover the mask is the product of an antique refinery practice, so called, cementation process of naturally occurring alloy of gold and silver, namely electrum. Complementary results of SEM-electron dispersion spectroscopy (EDS) and electron probe microanalysis (EPMA)-wavelength dispersion spectroscopy (WDS) provided chemical compositions of the golden leaf as well as in the plaster base of the mask. X-ray photoemission spectroscopy (XPS) revealed the presence of Au, Ag, Si, S, Cl, Ca, and N, in addition to O and C. Relative concentration of Au/Ag at the surface has been measured by XPS to be 70% to 30%. XPS depth profiling verified silver-enrichment at the surface, as ratio of gold to silver is measured to be 80% to 20% at the depth of 15 nm. XPS chemical mapping images of gold and silver confirmed a rather inhomogeneous character of Au/Ag relative concentration at the surface. The main diffraction peaks in the X-ray diffraction (XRD) spectrum coincide with diffraction peaks of pure gold, silver metals, and magnesium calcite Mg 0.03 Ca 0.97 CO 3 . Whereas, Raman spectroscopy results implied the existence of Ag 2 S, a tarnishing compound, on the golden area of the mask.

A noninvasive complementary study of an Egyptian polychrome cartonnage pigments using SEM, EPMA, and Raman spectroscopy

“…Golden areas in the fragment are associated with the funerary mask, which was decorated with gold leaves. An LG color region is also seen on the right‐hand side of the fragment, which was part of the hair of the mask 25 …”

High Sensitivity Sers Substrate of A Few Nanometers Single-Layer Silver Thickness Fabricated by DC Magnetron Sputtering Technology

“…The FWHMs of the 3d5/2 and 3d3/2 peaks of the as-deposit sample are 0.628 and 0.613 eV, respectively. The 3d5/2 peak was further analyzed to resolute a significant peak of Ag(0) located at 368.2 eV and the fainter peak of Ag(I), which is Ag2O, located at 368.7 eV [32]. C percentage compositions of Ag(0) and Ag(I) elements in Sample C stored in the different environments.…”

Protocol for the Analysis of Cross-Sections from Gilded Surfaces

“…Scientists have a number of analytical techniques they can use to address the questions outlined above, from optical microscopy, to scanning electron microscopy, to Raman microscopy and more [4][5][6][7][8][9]. However, to our knowledge, there is no recognised and/or published protocol that codifies the different steps to be taken for an efficient and effective resolution of the questions stated above.…”