2013 IEEE 22nd Conference on Electrical Performance of Electronic Packaging and Systems 2013
DOI: 10.1109/epeps.2013.6703468
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Applying a physics-based via model for the simulation of Through Silicon Vias

Abstract: This paper presents a first approach for the efficient modeling of Through Silicon Vias based on a Physics-Based Via model for application in silicon interposers with metallic boundaries

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Cited by 4 publications
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