2001
DOI: 10.1016/s0022-0248(01)00950-2
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As-soak control of the InAs-on-GaSb interface

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Cited by 47 publications
(24 citation statements)
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“…However, two types of interface can be epitaxied along the [0 0 1] growth direction because the InAs/GaSb heterojunction has no common element: an In/As/Ga/Sb sequence (''GaAs-like'' interface), or an As/In/Sb/Ga sequence (''InSb-like'' interface). Without a specifical shutter sequence, the InAs-on-GaSb interface is naturally ''InSb-like'' while the GaSb-on-InAs interface is ''GaAs-like'' and SLs with ''InSb-like'' interfaces have been found to have greater structural and luminescence properties [23][24][25][26][27][28]. Consequently, the InSb layer is inserted just after the InAs layer to eliminate ''GaAs-bonds'' and to promote strain compensation.…”
Section: Methodsmentioning
confidence: 99%
“…However, two types of interface can be epitaxied along the [0 0 1] growth direction because the InAs/GaSb heterojunction has no common element: an In/As/Ga/Sb sequence (''GaAs-like'' interface), or an As/In/Sb/Ga sequence (''InSb-like'' interface). Without a specifical shutter sequence, the InAs-on-GaSb interface is naturally ''InSb-like'' while the GaSb-on-InAs interface is ''GaAs-like'' and SLs with ''InSb-like'' interfaces have been found to have greater structural and luminescence properties [23][24][25][26][27][28]. Consequently, the InSb layer is inserted just after the InAs layer to eliminate ''GaAs-bonds'' and to promote strain compensation.…”
Section: Methodsmentioning
confidence: 99%
“…Techniques for characterizing superlattices include Xray Diffraction (XRD), [30][31][32][33][34] (scanning) transmission electron microscopy ((S)TEM), 28,35,36 scanning tunneling microscopy (STM), 34,37,38 and atom probe tomography (APT). 28,39,40 High-resolution XRD (HRXRD) has its own distinct advantages as a non-destructive characterization method, which can provide a global structural assessment of the superlattices.…”
Section: Introductionmentioning
confidence: 99%
“…Our theoretical calculations suggest that T 1 in the ͑110͒ superlattice under study here may be limited by compositional mixing at the interfaces, indicating that further improvements in the spin lifetime may be achievable through control and optimization of interface characteristics using targeted growth methods. [17][18][19][20][21] The InAs/GaSb superlattices were grown by molecular beam epitaxy on n-type ͓1 -2ϫ10 16 cm Ϫ3 ͔ ͑001͒ or ͑110͒oriented InAs substrates ͓(ϩ/Ϫ) 0.1 degree͔ in a Fisons VG-80 machine equipped with shuttered EPI group-III evaporators and shuttered EPI valved group-V cracker cells. The superlattice structures contain 2.1 nm thick InAs layers and 3.7-nm thick GaSb layers, with a total of 85 periods.…”
mentioning
confidence: 99%