2020
DOI: 10.1016/j.nimb.2020.06.026
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Assessing electron emission induced by pulsed ion beams: A time-of-flight approach

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Cited by 11 publications
(7 citation statements)
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“…the apparent similarity of neutralization in materials with such different properties as graphene and MoS2 [13]. The combination of the time-of-flight approach and use of large detectors allows for the emission products to be studied in coincidence with the ions [14], and can thus provide a better understanding of the effects of electron dynamics observable in ion-solid interactions [15]. Also from an applied perspective, studying charge exchange processes in the medium energy regime, in particular for more conventional ions, such as He or Ne, has recently gained additional relevance: in the emerging field of ion microscopy the projectile charge affects the detected secondary electron yields and, simultaneously, trajectory dependent energy loss in crystals allows for contrast in imaging [16,17].…”
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confidence: 99%
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“…the apparent similarity of neutralization in materials with such different properties as graphene and MoS2 [13]. The combination of the time-of-flight approach and use of large detectors allows for the emission products to be studied in coincidence with the ions [14], and can thus provide a better understanding of the effects of electron dynamics observable in ion-solid interactions [15]. Also from an applied perspective, studying charge exchange processes in the medium energy regime, in particular for more conventional ions, such as He or Ne, has recently gained additional relevance: in the emerging field of ion microscopy the projectile charge affects the detected secondary electron yields and, simultaneously, trajectory dependent energy loss in crystals allows for contrast in imaging [16,17].…”
mentioning
confidence: 99%
“…Hence, the unit permits for fine inline adjustment when used for charge fraction measurement and can be rotated away without the need to break the vacuum, e.g. for alignment of single crystalline target materials or coincidence measurements [6,14]. A 3D model of the apparatus with schematic diagram of the experimental setup is shown in Fig.…”
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confidence: 99%
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“…Plasmon decay allows for the emission of low-energy electrons, as a second order process. Lohmann et al [19] have recently studied the kinetic energy of electrons generated by the impact of ions on carbon and gold foils. These authors have shown that for incident, low-velocity ions (≈0.5 a.u.)…”
Section: Introductionmentioning
confidence: 99%
“…In order to justify these observations, a mechanism involving collective electron oscillations was considered. In particular, a contribution to the emitted electron sample from plasmon decay appeared to be the most likely possibility [19]. In [20] plasmon decay and emission of secondary electrons were studied in aluminum.…”
Section: Introductionmentioning
confidence: 99%